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PDF HY62U8200B Data sheet ( Hoja de datos )

Número de pieza HY62U8200B
Descripción 256K x8 bit 3.0V Low Power CMOS slow SRAM
Fabricantes Hynix Semiconductor 
Logotipo Hynix Semiconductor Logotipo



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Document Title
256K x8 bit 3.0V Low Power CMOS slow SRAM
Revision History
Revision No History
03 Initial Revision History Insert
Revised
- Improved operating current
Icc1 : 60mA => 30mA
04 Change the Notch Location of sTSOP
- Left-Top => Left-Center
05 Marking Information Add
Revised
- AC Test Condition Add : 5pF Test Load
- VIH max : Vcc + 0.2V => Vcc + 0.3V
06 Changed Logo
- HYUNDAI -> hynix
- Marking Information Change
HY62U8200B Series
256Kx8bit CMOS SRAM
Draft Date
Jul.29.2000
Remark
Final
Sep.04.2000 Final
Dec.04.2000 Final
Apr.30.2001 Final
www.DataSheet4U.com
This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility
for use of circuits described. No patent licenses are implied.
Rev 06 / Apr. 2001
Hynix Semiconductor

1 page




HY62U8200B pdf
Y62U8200B Series
AC CHARACTERISTICS
Vcc= 2.7V~3.3V, TA = 0°C to 70°C/ -25°C to 85°C(E)/ -40°C to 85°C(I), unless otherwise specified
# Symbol
Parameter
-70* -85 -10
Min. Max. Min. Max. Min. Max.
READ CYCLE
1 tRC
Read Cycle Time
70 - 85 - 100 -
2 tAA
Address Access Time
- 70 - 85 - 100
3 tACS Chip Select Access Time
- 70 - 85 - 100
4 tOE
Output Enable to Output Valid
- 40 - 45 - 50
5 tCLZ Chip Select to Output in Low Z
10 - 10 - 10 -
6 tOLZ Output Enable to Output in Low Z
5 -5-5-
7 tCHZ Chip Deselection to Output in High Z 0 20 0 25 0 30
8 tOHZ Out Disable to Output in High Z
0 20 0 25 0 30
9 tOH
Output Hold from Address Change
15 - 15 - 15 -
WRITE CYCLE
10 tWC Write Cycle Time
70 - 85 - 100 -
11 tCW Chip Selection to End of Write
60 - 70 - 80 -
12 tAW Address Valid to End of Write
60 - 70 - 80 -
13 tAS
Address Set-up Time
0 -0-0-
14 tWP Write Pulse Width
50 - 60 - 70 -
15 tWR Write Recovery Time
0 -0-0-
16 tWHZ Write to Output in High Z
0 20 0 25 0 30
17 tDW Data to Write Time Overlap
30 - 35 - 40 -
18 tDH
Data Hold from Write Time
0 -0-0-
19 tOW Output Active from End of Write
5 -5-5-
Note * measured with 30pF test load
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
AC TEST CONDITIONS
TA = 0°C to 70°C / -25°C to 85°C (E)/ -40°C to 85°C (I), unless otherwise specified
Parameter
Value
Input Pulse Level
0.4V to 2.2V
Input Rise and Fall Time
5ns
Input and Output Timing Reference Level
1.5V
Output Load
tCLZ,tOLZ,tCHZ,tOHZ,tWHZ,tOW
CL = 5pF + 1TTL Load
Others
CL = 100pF + 1TTL Load
CL = 30pF + 1TTL Load
Note
* : Test load is 30pF for 70ns device.
AC TEST LOADS
TTL
CL(1)
www.DataSheet4U.com
Note : 1 Including jig and scope capacitance
Rev 06 / Apr. 2001
4

5 Page





HY62U8200B arduino
Y62U8200B Series
32pin 8x13.4mm Smaller Thin Small Outline Package Standard(ST)
#1
#16
0.468(11.9)
0.460(11.7)
0.536(13.6)
0.520(13.2)
#32
0.319(8.1)
0.311(7.9)
#17
0.024(0.6)
0.016(0.4)
0.008(0.2)
0.004(0.1)
UNIT : INCH(mm)
0.020(0.50)
0.041(1.05)
0.037(0.95)
0.008(0.20)
0.002(0.05)
0.011(0.27)
0.007(0.17)
32pin 8x13.4mm Smaller Thin Small Outline Package Reversed(SR)
#16
#1
0.468(11.9)
0.460(11.7)
0.536(13.6)
0.520(13.2)
#17
0.319(8.1)
0.311(7.9)
#32
0.024(0.6)
0.016(0.4)
0.008(0.2)
0.004(0.1)
UNIT : INCH(mm)
0.020(0.50)
0.041(1.05)
0.037(0.95)
0.008(0.20)
0.002(0.05)
0.011(0.27)
0.007(0.17)
www.DataSheet4U.com
Rev 06 / Apr. 2001
10

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