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IP4234CZ6 fiches techniques PDF

NXP Semiconductors - Single USB 2.0 ESD protection to IEC 61000-4-2 level 4

Numéro de référence IP4234CZ6
Description Single USB 2.0 ESD protection to IEC 61000-4-2 level 4
Fabricant NXP Semiconductors 
Logo NXP Semiconductors 





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IP4234CZ6 fiche technique
IP4234CZ6
Single USB 2.0 ESD protection to IEC 61000-4-2 level 4
Rev. 01 — 16 April 2009
Product data sheet
1. Product profile
1.1 General description
The IP4234CZ6 is designed to protect Input/Output (I/O) USB 2.0 ports, that are sensitive
to capacitive loads, from being damaged by ElectroStatic Discharge (ESD). The π-filter
structure is implemented with a small series resistor to provide the necessary protection
to signal and supply components from ESD voltages greater than ±8 kV contact discharge
according IEC 61000-4-2, level 4.
The ESD protection is independent of the supply voltage due to the rail-to-rail diode
architecture being connected to a Zener diode.
The IP4234CZ6 is fabricated using monolithic silicon technology and integrates two
ultra-low capacitance π-filter ESD protection diodes plus a Zener diode in a miniature
6-lead SOT457 package.
1.2 Features
I Pb-free and RoHS compliant
I Simple, direct signal routing provides for high speed signal integrity
I ESD protection compliant to IEC 61000-4-2 level 4, ±8 kV contact discharge
I Significant reduction in peak clamping and peak residual current
I Four low input capacitance (2.0 pF typical) rail-to-rail ESD protection diodes
I Low voltage clamping due to an integrated Zener diode
I Small 6-lead SO6 (SOT457) package
I IEC 61000-4-5 15 A Lightning (8/20 µs) compliant
1.3 Applications
I General-purpose downstream ESD protection high frequency analog signals and
high-speed serial data transmission for ports inside:
N Cellular and PCS mobile handsets
N PC/Notebook USB2.0/IEEE1394 ports
N DVI interfaces
N HDMI interfaces
N Cordless telephones
N Wireless data (WAN/LAN) systems
N PDAs

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