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HUF76633P3_F085 fiches techniques PDF

Fairchild Semiconductor - Power MOSFET ( Transistor )

Numéro de référence HUF76633P3_F085
Description Power MOSFET ( Transistor )
Fabricant Fairchild Semiconductor 
Logo Fairchild Semiconductor 





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HUF76633P3_F085 fiche technique
Data Sheet
HUF76633P3_F085
April 2012
38A, 100V, 0.036 Ohm, N-Channel, Logic
Level UltraFET® Power MOSFET
Packaging
JEDEC TO-220AB
SOURCE
DRAIN
GATE
Symbol
DRAIN
(FLANGE)
D
G
S
Features
• Ultra Low On-Resistance
- rDS(ON) = 0.035Ω, VGS = 10V
- rDS(ON) = 0.036Ω, VGS = 5V
• Simulation Models
- Temperature Compensated PSPICE® and SABER™
Electrical Models
- Spice and SABER Thermal Impedance Models
- www.Fairchildsemi.com
• Peak Current vs Pulse Width Curve
• UIS Rating Curve
• Switching Time vs RGS Curves
Qualified to AEC Q101
RoHS Compliant
Ordering Information
PART NUMBER
HUF76633P3_F085
PACKAGE
TO-220AB
BRAND
76633P
Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified
Ratings
Units
Drain to Source Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . VDSS
Drain to Gate Voltage (RGS = 20k) (Note 1) . . . . . . . . . . . . . VDGR
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VGS
Drain Current
Continuous
Continuous
Continuous
Continuous
(TC=
(TC=
(TC=
(TC=
1122005500ooCCooCC,, VV,, VVGGGGSSSS====15V450.VV)5))V.()F.. (i..gF..uig..rue.. r..e2..)2.. )...
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ID
ID
ID
ID
Pulsed Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM
Pulsed Avalanche Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . UIS
100
100
±16
38
39
27
27
Figure 4
Figures 6, 17, 18
V
V
V
A
A
A
A
Power Dissipation . . .
Derate Above 25oC.
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PD
..
Operating and Storage Temperature . . . . . . . . . . . . . . . . . TJ, TSTG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s . . . . . . . . . . . . . . TL
Package Body for 10s, See Techbrief TB334 . . . . . . . . . . . . . Tpkg
NOTES:
1. TJ = 25oC to 150oC.
145
0.97
-55 to 175
300
260
W
W/oC
oC
oC
oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Product reliability information can be found at http://www.fairchildsemi.com/products/discrete/reliability/index.html
For severe environments, see our Automotive HUFA series.
All Fairchild semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification.
©2012 Fairchild Semiconductor Corporation
HUF76633P3_F085 Rev. C1
1
www.fairchildsemi.com

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