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PDF ACS770LCB-100B-PFF-T Data sheet ( Hoja de datos )

Número de pieza ACS770LCB-100B-PFF-T
Descripción High Precision Linear Current Sensor IC
Fabricantes Allegro MicroSystems 
Logotipo Allegro MicroSystems Logotipo



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No Preview Available ! ACS770LCB-100B-PFF-T Hoja de datos, Descripción, Manual

ACS770xCB
Thermally Enhanced, Fully Integrated, Hall Effect-Based
High Precision Linear Current Sensor IC with 100 μΩ Current Conductor
Features and Benefits
Industry-leading total output accuracy achieved with new
piecewise linear digital temperature compensation of
offset and sensitivity
Industry-leading noise performance through proprietary
amplifier and filter design techniques
120 kHz typical bandwidth
4.1 μs output rise time in response to step input current
Integrated shield greatly reduces capacitive coupling from
current conductor to die due to high dV/dt signals, and
prevents offset drift in high-side, high voltage applications
Greatly improved total output error through digitally
programmed and compensated gain and offset over the full
operating temperature range
Small package size, with easy mounting capability
Monolithic Hall IC for high reliability
Ultra-low power loss: 100 μΩ internal conductor resistance
Galvanic isolation allows use in economical, high-side
current sensing in high voltage systems
4.5 to 5.5 V, single supply operation
Output voltage proportional to AC or DC currents
Factory-trimmed for accuracy
Extremely stable output offset voltage
Undervoltage lockout for VCC below specification
AEC Q-100 automotive qualified
UL certified, File No. E316429
Package: 5-pin package (suffix CB)
Tytpeested
PFF
Leadform
PSF
Leadform
TÜV America
Certificate Number:
U8V 13 08 54214 027
Additional leadforms available for qualifying volumes
Description
The AllegroACS770 family of current sensor ICs provides
economical and precise solutions forAC or DC current sensing.
Typical applications include motor control, load detection and
management, power supply and DC-to-DC converter control,
inverter control, and overcurrent fault detection.
The device consists of a precision, low-offset linear Hall
circuit with a copper conduction path located near the die.
Applied current flowing through this copper conduction
path generates a magnetic field that is concentrated by a low
magnetic hysteresis core, then converted by the Hall IC into a
proportional voltage. Device accuracy is optimized through the
close proximity of the magnetic signal to the Hall transducer.
A precise, proportional output voltage is provided by the
low-offset, chopper-stabilized BiCMOS Hall IC, which is
programmed for accuracy at the factory. Proprietary digital
temperature compensation technology greatly improves the
IC accuracy and temperature stability without influencing the
high bandwidth operation of the analog output.
High level immunity to current conductor dV/dt and stray
electric fields is offered byAllegro proprietary integrated shield
technology for low output voltage ripple and low offset drift
in high-side, high voltage applications.
The output of the device has a positive slope (>VCC/2 for
bidirectional devices) when an increasing current flows through
the primary copper conduction path (from terminal 4 to terminal
5), which is the path used for current sampling. The internal
resistance of this conductive path is 100 μΩ typical, providing
low power loss.
The thickness of the copper conductor allows survival of the
device at high overcurrent conditions. The terminals of the
Continued on the next page…
Typical Application
Application 1. The ACS770 outputs an analog signal,
VOUT, that varies linearly with the bidirectional AC or DC
primary sampled current, IP, within the range specified.
RF and CF are for optimal noise management, with
values that depend on the application.
4 IP+
VCC 1
ACS770
IP GND 2
5
IP– VIOUT 3
5V
CBYP
0.1 μF
CF
RF
VOUT
ACS770-DS

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ACS770LCB-100B-PFF-T pdf
ACS770xCB
Thermally Enhanced, Fully Integrated, Hall Effect-Based
High Precision Linear Current Sensor IC with 100 μΩ Current Conductor
V+
VCC
IP+
C BYP
IP–
Functional Block Diagram
To all subcircuits
Temperature
Sensor
Programming
Control
EEPROM and
Control Logic
Sensitivity Control
Offset Control
Signal Recovery
GND
VIOUT
CL
Pin-out Diagram
Terminal List Table
Number
Name
1 VCC
2 GND
3 VIOUT
4 IP+
5 IP–
IP+ 4
IP– 5
3 VIOUT
2 GND
1 VCC
Description
Device power supply terminal
Signal ground terminal
Analog output signal
Terminal for current being sampled
Terminal for current being sampled
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
5

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ACS770LCB-100B-PFF-T arduino
ACS770xCB
Thermally Enhanced, Fully Integrated, Hall Effect-Based
High Precision Linear Current Sensor IC with 100 μΩ Current Conductor
X150B PERFORMANCE CHARACTERISTICS1: TOP = –40°C to 125°C, CBYP = 0.1 μF, VCC= 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min. Typ. Max. Unit
Primary Sampled Current
Sensitivity2
Sensitivity Drift Over Lifetime3
IP
SensTA Measured using full scale IP, TA = 25°C
Sens(TOP)HT Measured using full scale IP, TOP = 25°C to 150°C
Sens(TOP)LT Measured using full scale IP, TOP = –40°C to 25°C
ΔSensLIFE
TOP = –40°C to 125°C, shift after AEC Q100 grade 0 qualifica-
tion testing
–150
13.01
13.01
12.86
–0.24
13.33
13.33
13.33
±0.08
150
13.65
13.65
13.8
0.24
A
mV/A
mV/A
mV/A
mV/A
Noise4
Nonlinearity
Electrical Offset Voltage5,6
Electrical Offset Voltage Drift
Over Lifetime3
VNOISE TA= 25°C, 10 nF on VIOUT pin to GND
ELIN Measured using full scale and half scale IP
VOE(TA) IP = 0 A, TA = 25°C
VOE(TOP)HT IP = 0 A, TOP = 25°C to 125°C
VOE(TOP)LT IP = 0 A, TOP = –40°C to 25°C
VOE(LIFE)
IP = 0 A, TOP = –40°C to 125°C, shift after AEC Q100 grade 0
qualification testing
–4
–1 –
–10 ±4
–10 ±6
–20 ±6
–5 ±2
mV
1%
10 mV
10 mV
20 mV
5 mV
Magnetic Offset Error
Total Output Error7
Total Output Error Drift Over
Lifetime3
IERROM
ETOT(TA)
ETOT(HT)
ETOT(LT)
ΔETOT(LIFE)
IP = 0 A, TA = 25°C, after excursion of 150 A
Measured using full scale IP, TA = 25°C
Measured using full scale IP, TOP = 25°C to 150°C
Measured using full scale IP, TOP = –40°C to 25°C
TOP = –40°C to 125°C, shift after AEC Q100 grade 0 qualifica-
tion testing
– 225
–2.4 ±0.5
–2.4 ±1.5
–3.5 ±2
–1.9 ±0.6
500
2.4
2.4
3.5
1.9
mA
%
%
%
%
1See Characteristic Performance Data page for parameter distributions over temperature range.
2This parameter may drift a maximum of ΔSensLIFE over lifetime.
3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot
be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information.
4±3 sigma noise voltage.
5Drift is referred to ideal VIOUT(QBI) = 2.5 V.
6This parameter may drift a maximum of ΔVOE(LIFE) over lifetime.
7This parameter may drift a maximum of ΔETOT(LIFE) over lifetime.
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
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