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PDF TSL235 Data sheet ( Hoja de datos )

Número de pieza TSL235
Descripción LIGHTTOFREQUENCY CONVERTER
Fabricantes TAOS 
Logotipo TAOS Logotipo



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No Preview Available ! TSL235 Hoja de datos, Descripción, Manual

t
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D High-Resolution Conversion of Light
Intensity to Frequency With No External
Components
D Communicates Directly With a
Microcontroller
D Compact Three-Leaded Clear-Plastic
Package
D Single-Supply Operation Down to 2.7 V
D Nonlinearity Error Typically 0.2% at 100 kHz
D Stable 100 ppm/°C Temperature Coefficient
D Single-Supply Operation
TSL235
LIGHTĆTOĆFREQUENCY CONVERTER
SR PACKAGE
(FRONT VIEW)
TAOS003 – MAY 1999
1 23
Description
GND VDD OUT
The TSL235 light-to-frequency converter combines a silicon photodiode and a current-to-frequency converter
on a single monolithic CMOS integrated circuit. The output is a square wave (50% duty cycle) with frequency
directly proportional to light intensity. Because it is TTL compatible, the output allows direct interface to a
microcontroller or other logic circuitry. The device has been temperature compensated for the ultraviolet-
to-visible light range of 300 nm to 700 nm and responds over the light range of 300 nm to 1100 nm. The TSL235
is characterized for operation over the temperature range of –25°C to 70°C.
Functional Block Diagram
Light
Photodiode
Current-to-Frequency
Converter
Output
Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, VDD (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.5 V
Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –25°C to 70°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –25°C to 85°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240°C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to GND.
www.taosinc.com
Texas Advantced Optoelectronic Solutions Inc.
800 Jupiter Road, Suite 205 S Plano, TX 75074 S (972) 673-0759
t
Copyright © 2000, TAOS Inc.
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TSL235 pdf
TSL235
LIGHTĆTOĆFREQUENCY CONVERTER
APPLICATION INFORMATION
TAOS003 – MAY 1999
Power-supply considerations
For optimum device performance, power-supply lines should be decoupled by a 0.01-µF to 0.1-µF capacitor
with short leads (see Figure 6).
Output interface
The output of the device is designed to drive a standard TTL or CMOS logic input over short distances. If lines
greater than 12 inches are used on the output, a buffer or line driver is recommended.
Measuring the frequency
The choice of interface and measurement technique depends on the desired resolution and data-acquisition
rate. For maximum data-acquisition rate, period-measurement techniques are used.
Period measurement requires the use of a fast reference clock with available resolution directly related to
reference-clock rate. The technique is employed to measure rapidly varying light levels or to make a fast
measurement of a constant light source.
Maximum resolution and accuracy may be obtained using frequency-measurement, pulse-accumulation, or
integration techniques. Frequency measurements provide the added benefit of averaging out random- or
high-frequency variations (jitter) resulting from noise in the light signal. Resolution is limited mainly by available
counter registers and allowable measurement time. Frequency measurement is well suited for slowly varying
or constant light levels and for reading average light levels over short periods of time. Integration, the
accumulation of pulses over a very long period of time, can be used to measure exposure — the amount of light
present in an area over a given time period.
VDD
0.1 µF
2
TSL235
3
1
Timer/Port
MCU
Figure 6. Typical TSL235 Interface to a Microcontroller
www.taosinc.com
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