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PDF M2N2G64TU8HG4B Data sheet ( Hoja de datos )

Número de pieza M2N2G64TU8HG4B
Descripción Unbuffered DDR2 SO-DIMM
Fabricantes Nanya 
Logotipo Nanya Logotipo



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No Preview Available ! M2N2G64TU8HG4B Hoja de datos, Descripción, Manual

M2N1G64TUH8G5F / M2S1G64TUH8G4F / M2N2G64TU8HG5B / M2N2G64TU8HG4B
1GB: 128M x 64 / 2GB: 256M x 64
PC2-5300 / PC2-6400
Unbuffered DDR2 SO-DIMM
Based on DDR2-667/800 64Mx16 (1GB)/128Mx8 (2GB) SDRAM G-Die
Features
Performance:
Speed Sort
PC2-5300 PC2-6400
-3C -AC Unit
DIMM CAS Latency
5
5
fck Clock Freqency
333
400 MHz
tck Clock Cycle 3 2.5 ns
Data Transfer Speed
667
800 Mbps
200-Pin Small Outline Dual In-Line Memory Module (SO-DIMM)
1GB: 128Mx64 Unbuffered DDR2 SO-DIMM based on 64M x16
DDR2 SDRAM G-Die devices.
2GB: 256Mx64 Unbuffered DDR2 SO-DIMM based on 128M x8
DDR2 SDRAM G-Die devices.
Intended for 333MHz and 400MHz applications
• Inputs and outputs are SSTL-18 compatible
VDD = VDDQ = 1.8V ±0.1V
• SDRAMs have 8 internal banks for concurrent operation
• Differential clock inputs
• Data is read or written on both clock edges
DRAM DLL aligns DQ and DQS transitions with clock transitions.
Address and control signals are fully synchronous to positive
clock edge
• Auto Refresh (CBR) and Self Refresh Modes
Automatic and controlled precharge commands
• Programmable Operation:
- DIMM  Latency: 3, 4, 5
- Burst Type: Sequential or Interleave
- Burst Length: 4, 8
- Operation: Burst Read and Write
• 13/10/2 Addressing (1GB)
• 14/10/2 Addressing (2GB)
7.8 s Max. Average Periodic Refresh Interval
• Serial Presence Detect
• Gold contacts
1GB modules SDRAMs are 84-ball BGA Package
2GB modules SDRAMs are 60-ball BGA Package
RoHS compliance
Description
M2N1G64TUH8G5F / M2S1G64TUH8G4F / M2N2G64TU8HG5B / M2N2G64TU8HG4B are unbuffered 200-Pin Double Data Rate 2
(DDR2) Synchronous DRAM Small Outline Dual In-Line Memory Module (SO-DIMM), organized as two ranks of 128Mx64 (1GB)/256Mx64
(2GB) high-speed memory array. M2N1G64TUH8G5F / M2S1G64TUH8G4F uses eight 64Mx16 84-ball BGA packaged devices and
M2N2G64TU8HG5B / M2N2G64TU8HG4B uses sixteen 128Mx8 60-ball BGA packaged devices. These DIMMs are manufactured using
raw cards developed for broad industry use as reference designs. The use of these common design files minimizes electrical variation
between suppliers. All Elixir DDR2 SODIMMs provide a high-performance, flexible 8-byte interface in a space-saving footprint.
The DIMM is intended for use in applications operating of 333MHz/400MHz clock speeds and achieves high-speed data transfer speed of
667Mbps/800Mbps. Prior to any access operation, the device  latency and burst/length/operation type must be programmed into the
DIMM by address inputs A0-A12 (1GB) / A0-A13 (2GB) and I/O inputs BA0, BA1 and BA2 using the mode register set cycle.
The DIMM uses serial presence-detect implemented via a serial EEPROM using a standard IIC protocol. The first 128 bytes of SPD data are
programmed and locked during module assembly. The remaining 128 bytes are available for use by the customer.
REV 1.0
07/2010
1
© NANYA TECHNOLOGY CORPORATION
NANYA reserves the right to change products and specifications without notice.

1 page




M2N2G64TU8HG4B pdf
M2N1G64TUH8G5F / M2S1G64TUH8G4F / M2N2G64TU8HG5B / M2N2G64TU8HG4B
1GB: 128M x 64 / 2GB: 256M x 64
PC2-5300 / PC2-6400
Unbuffered DDR2 SO-DIMM
Functional Block Diagram
[1GB 2 Ranks, 64Mx16 DDR2 SDRAMs]
3 Ohms +/- 5%
ODT1
ODT0
CKE1
CKE0



DQS0
DM0
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7

DQS1
DM1
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
 
LDQS
LDM
C
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D0
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
  C
LDQS
LDM
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D4
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T

DQS4
DM4
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39

DQS5
DM5
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
 
LDQS
LDM
C
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D2
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
  C
LDQS
LDM
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D6
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T

DQS2
DM2
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23

DQS3
DM3
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
 
LDQS
LDM
C
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D1
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
  C
LDQS
LDM
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D5
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T

DQS6
DM6
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55

DQS7
DM7
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
 
LDQS
LDM
C
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D3
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
  C
LDQS
LDM
K
E
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
 D7
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
BA0- BA2
A0- A 12



SDRAMS D0-D7
SDRAMS D0-D7
SDRAMS D0-D7
SDRAMS D0-D7
SDRAMS D0-D7
V DDSPD
VDD
VREF
VSS
VDDID
SPD
D0-D7, VDD and VDDQ
D0-D7
D0-D7, SPD
CK0

CK1

4 loads
4 loads
Notes:
1. DQ wiring may differ from that described in this drawing.
2. DQ/DQS/DM/CKE/S S relationships are maintained as shown.
3. DQ/DQS/DM/DQS resistors are 22 +/- 5% Ohms
4. VDDID strap connections (for memory device VDD,VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
STRAP IN (VSS ): VDD is not equal to VDDQ
REV 1.0
07/2010
5
SCL
SA0
SA1
WP
Serial PD
A0 A1
SA0 SA1
A2
SDA
© NANYA TECHNOLOGY CORPORATION
NANYA reserves the right to change products and specifications without notice.

5 Page





M2N2G64TU8HG4B arduino
M2N1G64TUH8G5F / M2S1G64TUH8G4F / M2N2G64TU8HG5B / M2N2G64TU8HG4B
1GB: 128M x 64 / 2GB: 256M x 64
PC2-5300 / PC2-6400
Unbuffered DDR2 SO-DIMM
Environmental Requirements
Symbol
Parameter
Rating
Units
TOPR
HOPR
TSTG
HSTG
Operating Temperature (ambient)
Operating Humidity (relative)
Storage Temperature
Storage Humidity (without condensation)
Barometric pressure (operating & storage) up to 9850ft.
0 to 65
10 to 90
-50 to 100
5 to 95
105 to 69
°C
%
°C
%
kPa
Note: Stress greater than those listed may cause permanent damage to the device. This is a stress rating only and device functional
operation at or above the conditions indicated is not implied. Exposure to absolute maximum rating conditions for extended periods may
affect reliability
Absolute Maximum DC Ratings
Symbol
Parameter
Rating
Units
VDD Voltage on VDD pins relative to Vss
-1.0 to +2.3
V
VDDQ
Voltage on VDDQ pins relative to Vss
-0.5 to +2.3
V
VDDL
Voltage on VDDL pins relative to Vss
-0.5 to +2.3
V
VIN, VOUT Voltage on I/O pins relative to Vss
-0.5 to +2.3
V
TSTG
Storage Temperature (Plastic)
-55 to +100
°C
Note: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is stress
rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Storage temperature is the case surface temperature on the center/top side of the DRAM.
Operating temperature Conditions
Symbol
Parameter
TCASE
Operating Temperature (Ambient)
Note:
1.
2.
Case temperature is measured at top and center side of any DRAMs.
tCASE > 85°C tREFI = 3.9 μs
Rating
0 to 95
Units
°C
Note
1
DC Electrical Characteristics and Operating Conditions
Symbol
Parameter
Min
Max
Units Notes
VDD Supply Voltage
1.7 1.9 V 1
VDDL DLL Supply Voltage
1.7 1.9 V 1
VDDQ Output Supply Voltage
1.7 1.9 V 1
VSS, VSSQ Supply Voltage, I/O Supply Voltage
0 0V
VREF
VTT
Input Reference Voltage
Termination Voltage
0.49VDDQ 0.51VDDQ
VREF 0.04 VREF + 0.04
V
V
1, 2
3
Note:
1. There is no specific device VDD supply voltage requirement for SSTL_18 compliance. However, VDDQ must be less than or equal to
VDD under all conditions.
2. VREF is expected to be equal to 0.5 V DDQ of the transmitting device, and to track variations in the DC level of the same. Peak-to-peak
noise on VREF may not exceed 2% of the DC value.
3. VTT of transmitting device must track VREF of receiving device.
REV 1.0
07/2010
11
© NANYA TECHNOLOGY CORPORATION
NANYA reserves the right to change products and specifications without notice.

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