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Intersil Corporation - Radiation Hardened Dual Decade Ripple Counter

Numéro de référence HCTS390MS
Description Radiation Hardened Dual Decade Ripple Counter
Fabricant Intersil Corporation 
Logo Intersil Corporation 





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HCTS390MS fiche technique
Data Sheet
HCTS374T
July 1999 File Number 4627.1
Radiation Hardened Octal D-Type
Flip-Flop, Three-State, Positive Edge
Triggered
Intersil’s Satellite Applications FlowTM (SAF) devices are fully
tested and guaranteed to 100kRAD total dose. These QML
Class T devices are processed to a standard flow intended
to meet the cost and shorter lead-time needs of large
volume satellite manufacturers, while maintaining a high
level of reliability.
The Intersil HCTS374T is a Radiation Hardened Non-
Inverting Octal D-type, Positive Edge Triggered Flip-Flop
with three-state outputs. The eight flip-flops enter data into
their registers on the LOW-to-HIGH transition of the clock
(CP). Data is also transferred to the outputs during this
transition. The output enable (OE) controls the three-state
outputs and is independent of the register operation. When
the output enable is high, the outputs are in the high
impedance state.
Specifications
Specifications for Rad Hard QML devices are controlled by
the Defense Supply Center in Columbus (DSCC). The SMD
numbers listed below must be used when ordering.
Detailed Electrical Specifications for the HCTS374T are
contained in SMD 5962-95748. A “hot-link” is provided from
our website for downloading.
www.intersil.com/spacedefense/newsafclasst.asp
Intersil’s Quality Management Plan (QM Plan), listing all
Class T screening operations, is also available on our
website.
www.intersil.com/quality/manuals.asp
Ordering Information
ORDERING
NUMBER
PART
NUMBER
TEMP.
RANGE
(oC)
5962R9574801TRC
HCTS374DTR
-55 to 125
5962R9574801TXC
HCTS374KTR
-55 to 125
NOTE: Minimum order quantity for -T is 150 units through
distribution, or 450 units direct.
Features
• QML Class T, Per MIL-PRF-38535
• Radiation Performance
- Gamma Dose (γ) 1 x 105 RAD(Si)
- Latch-Up Free Under Any Conditions
- SEP Effective LET No Upsets: >100 MEV-cm2/mg
- Single Event Upset (SEU) Immunity < 2 x 10-9
Errors/Bit-Day (Typ)
• 3 Micron Radiation Hardened SOS CMOS
• Fanout (Over Temperature Range)
- Bus Driver Outputs - 15 LSTTL Loads
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii 5mA at VOL, VOH
Pinouts
HCTS374T (SBDIP), CDIP2-T20
TOP VIEW
OE 1
Q0 2
D0 3
D1 4
Q1 5
Q2 6
D2 7
D3 8
Q3 9
GND 10
20 VCC
19 Q7
18 D7
17 D6
16 Q6
15 Q5
14 D5
13 D4
12 Q4
11 CP
OE
Q0
D0
D1
Q1
Q2
D2
D3
Q3
GND
HCTS374T (FLATPACK), CDFP4-F20
TOP VIEW
1 20
2 19
3 18
4 17
5 16
6 15
7 14
8 13
9 12
10 11
VCC
Q7
D7
D6
Q6
Q5
D5
D4
Q4
CP
1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
Satellite Applications Flow™ (SAF) is a trademark of Intersil Corporation.

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