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PDF HCTS139MS Data sheet ( Hoja de datos )
| Número de pieza | HCTS139MS | |
| Descripción | Radiation Hardened Dual 2-to-4 Line Decoder/Demultiplexer | |
| Fabricantes | Intersil Corporation | |
| Logotipo |  |
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HCTS139MS
September 1995
Radiation Hardened Dual
2-to-4 Line Decoder/Demultiplexer
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
- Bus Driver Outputs - 15 LSTTL Loads
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Pinouts
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16
TOP VIEW
E1 1 1
A0 1 2
A1 1 3
Y0 1 4
Y1 1 5
Y2 2 6
Y3 1 7
GND 8
16 VCC
15 2 E
14 2 A0
13 2 A1
12 2 Y0
11 2 Y1
10 2 Y2
9 2 Y3
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F16
TOP VIEW
Description
The Intersil HCTS139MS is a Radiation Hardened 2-to-4 line
Decoder/Demultiplexer with an active low enable (E). Data
on the select inputs (A0, A1) cause one of the four normally
high outputs to go to a low logic level. The Demultiplexing
function is performed by using the enable input as the data
input.
The HCTS139MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family
with TTL input compatibility.
The HCTS139MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
E1
A0 1
A1 1
Y0 1
Y1 1
Y2 1
Y3 1
GND
1 16
2 15
3 14
4 13
5 12
6 11
7 10
89
VCC
2E
2 A0
2 A1
2 Y0
2 Y1
2 Y2
2 Y3
Ordering Information
PART NUMBER
HCTS139DMSR
HCTS139KMSR
HCTS139D/Sample
HCTS139K/Sample
HCTS139HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
520
Spec Number 518606
File Number 2231.2
1 page  
Specifications HCTS139MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
Noise Immunity
Functional Test
A0, A1 to Output
Enable to Output
SYMBOL
(NOTES 1, 2)
CONDITIONS
FN VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, (Note 3)
TPHL,
TPLH
VCC = 4.5V
TPHL,
TPLH
VCC = 4.5V
TEMPERATURE
+25oC
200K RAD
LIMITS
MIN MAX UNITS
---
+25oC
2 27 ns
+25oC
2 27 ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC 5 12µA
IOL/IOH
5 -15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
Spec Number 518606
524
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