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PDF HCS151D Data sheet ( Hoja de datos )
| Número de pieza | HCS151D | |
| Descripción | Radiation Hardened 8-Input Multiplexer | |
| Fabricantes | Intersil Corporation | |
| Logotipo |  |
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HCS154MS
September1995
Radiation Hardened
4-to-16 Line Decoder/Demultiplexer
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 Rads (Si)/s
• Dose Rate Upset >1010 RAD(Si)/s 20ns Pulse
• Cosmic Ray Upset Immunity < 2 x 10-9 Errors/Gate Day
(Typ)
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCS154MS is a Radiation Hardened 4 to 16 line
Decoder/Demultiplexer with two enable inputs. A high on
either enable input forces the output to a high state. The
Demultiplexing function is performed by using the four input
lines A0 to A3 to select the desired output states.
The HCS154MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCS154MS is supplied in a 24 lead Ceramic flatpack (K
suffix) or a SBDIP Package (D suffix).
Pinouts
24 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T24
TOP VIEW
Y0 1
Y1 2
Y2 3
Y3 4
Y4 5
Y5 6
Y6 7
Y7 8
Y8 9
Y9 10
Y10 11
GND 12
24 VCC
23 A0
22 A1
21 A2
20 A3
19 E2
18 E1
17 Y15
16 Y14
15 Y13
14 Y12
13 Y11
24 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F24
TOP VIEW
Y0 1 24
Y1 2 23
Y2 3 22
Y3 4 21
Y4 5 20
Y5 6 19
Y6 7 18
Y7 8 17
Y8 9 16
Y9 10 15
Y10 11 14
ND 12 13
VCC
A0
A1
A2
A3
E2
E1
Y15
Y14
Y13
Y12
Y11
Ordering Information
PART NUMBER
HCS154DMSR
HCS154KMSR
HCS154D/Sample
HCS154K/Sample
HCS154HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
24 Lead SBDIP
24 Lead Ceramic Flatpack
24 Lead SBDIP
24 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
1
Spec Number 518754
File Number 2479.2
1 page  
Specifications HCS154MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETERS
Output Voltage High
Input Leakage Current
Noise Immunity
Functional Test
Address to Output
Enable to Output
SYMBOL
(NOTES 1, 2)
CONDITIONS
VOH
VCC = 4.5V or 5.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), IOH = -50µA
IIN VCC = 5.5V, VIN = VCC or GND
FN VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), (Note 3)
TPLH VCC = 4.5V
TPHL VCC = 4.5V
TPLH
TPHL
VCC = 4.5V
TEMPERATURE
+25oC
+25oC
+25oC
200K RAD
LIMITS
MIN MAX UNITS
VCC
-0.1
-
V
- ±5 µA
---
+25oC
+25oC
+25oC
2 34 ns
2 31 ns
2 27 ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC 5 12µA
IOL/IOH
5 -15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
Spec Number 518754
5
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| PDF Descargar | [ Datasheet HCS151D.PDF ] | |
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