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HCPL-2200 fiches techniques PDF

Agilent(Hewlett-Packard) - Very High CMR/ Wide VCC Logic Gate Optocouplers

Numéro de référence HCPL-2200
Description Very High CMR/ Wide VCC Logic Gate Optocouplers
Fabricant Agilent(Hewlett-Packard) 
Logo Agilent(Hewlett-Packard) 





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HCPL-2200 fiche technique
H
Low Input Current Logic Gate
Optocouplers
Technical Data
HCPL-2200
HCPL-2219
Features
• 2.5 kV/µs Minimum Common
Mode Rejection (CMR) at
VCM = 400 V (HCPL-2219)
• Compatible with LSTTL,
TTL, and CMOS Logic
• Wide VCC Range (4.5 to 20 V)
• 2.5 Mbd Guaranteed over
Temperature
• Low Input Current (1.6 mA)
• Three State Output (No
Pullup Resistor Required)
• Guaranteed Performance
from 0°C to 85°C
• Hysteresis
• Safety Approval
UL Recognized -2500 V rms
for 1 minute
CSA Approved
VDE 0884 Approved with
VIORM = 630 V peak
(HCPL-2219 Option 060
Only)
• MIL-STD-1772 Version
Available (HCPL-5200/1)
Applications
• Isolation of High Speed
Logic Systems
• Computer-Peripheral
Interfaces
• Microprocessor System
Interfaces
• Ground Loop Elimination
• Pulse Transformer
Replacement
• Isolated Buss Driver
• High Speed Line Receiver
Description
The HCPL-2200/2219 are
optically coupled logic gates that
combine a GaAsP LED and an
integrated high gain photo
detector. The detector has a three
state output stage and has a
Functional Diagram
NC 1
ANODE 2
CATHODE 3
NC 4
SHIELD
8 VCC
7 VO
6 VE
5 GND
detector threshold with hysteresis.
The three state output eliminates
the need for a pullup resistor and
allows for direct drive of data
busses. The hysteresis provides
differential mode noise immunity
and eliminates the potential for
output signal chatter.
A superior internal shield on the
HCPL-2219 guarantees common
mode transient immunity of
2.5 kV/µs at a common mode
voltage of 400 volts.
TRUTH TABLE
(POSITIVE LOGIC)
LED ENABLE OUTPUT
ON
OFF
ON
OFF
H
H
L
L
Z
Z
H
L
A 0.1 µF bypass capacitor must be connected between pins 5 and 8.
CAUTION: It is advised that normal static precautions be taken in handling and assembly of this
component to prevent damage and/or degradation which may be induced by ESD.
1-120
5965-3596E

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