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RN2909AFS fiches techniques PDF

Toshiba - (RN2907AFS - RN2909AFS) Transistor Silicon PNP Epitaxial Type

Numéro de référence RN2909AFS
Description (RN2907AFS - RN2909AFS) Transistor Silicon PNP Epitaxial Type
Fabricant Toshiba 
Logo Toshiba 





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RN2909AFS fiche technique
RN2907AFS~RN2909AFS
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Transistor with Built-in Bias Resistor)
RN2907AFS, RN2908AFS, RN2909AFS
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
Two devices are incorporated into a fine-pitch, small-mold (6-pin)
package.
Incorporating a bias resistor into a transistor reduces the parts count.
Reducing the parts count enables the manufacture of ever more
compact equipment and lowers assembly costs.
Complementary to the RN1907AFS to RN1909AFS
Equivalent Circuit and Bias Resistor Values
0.1±0.05
1.0±0.05
0.8±0.05
Unit: mm
0.1±0.05
16
25
34
C
R1
B
E
Type No.
RN2907AFS
RN2908AFS
RN2909AFS
R1 (kΩ)
10
22
47
R2 (kΩ)
47
47
22
1. EMITTER1 (E1)
2. BASE1
(B1)
3. COLLECTOR2 (C2)
4. EMITTER2 (E2)
5. BASE2
(B2)
fS6 6. COLLECTOR1 (C1)
JEDEC
JEITA
TOSHIBA
2-1F1D
Weight: 1 mg (typ.)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Characteristic
Symbol
Rating
Collector-base voltage
Collector-emitter voltage
RN2907AFS to RN2909AFS
RN2907AFS
Emitter-base voltage
RN2908AFS
RN2909AFS
Collector current
Collector power dissipation
RN2907AFS to RN2909AFS
Junction temperature
Storage temperature range
VCBO
50
VCEO
50
6
VEBO
7
15
IC 80
PC (Note 1)
50
Tj 150
Tstg 55 to 150
Unit
V
V
V
mA
mW
°C
°C
Equivalent Circuit
(top view)
654
Q1 Q2
123
Note:
Note 1:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Total rating
1 2010-05-14
Free Datasheet http://www.datasheet4u.com/

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