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PDF NCV8460A Data sheet ( Hoja de datos )

Número de pieza NCV8460A
Descripción Self Protected High Side Driver
Fabricantes ON Semiconductor 
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No Preview Available ! NCV8460A Hoja de datos, Descripción, Manual

NCV8460A
Self Protected High Side
Driver with Temperature
Shutdown and Current Limit
The NCV8460A is a fully protected HighSide driver that can be
used to switch a wide variety of loads, such as bulbs, solenoids and
other acuators. The device is internally protected from an overload
condition by an active current limit and thermal shutdown.
A diagnostic output reports ON and OFF state open load conditions
as well as thermal shutdown.
Features
Short Circuit Protection
Thermal Shutdown with Automatic Restart
CMOS (3.3 V / 5 V) compatible control input
Open Load Detection in On and Off State
Diagnostic Output
Undervoltage and Overvoltage Shutdown
Loss of Ground Protection
ESD protection
Slew Rate Control for Low EMI Switching
Very Low Standby Current
NCV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC Qualified andhttp://www.DataSheet4U.net/
PPAP Capable
These Devices are PbFree and are RoHS Compliant
Typical Applications
Switch a Variety of Resistive, Inductive and Capacitive Loads
Can Replace Electromechanical Relays and Discrete Circuits
Automotive / Industrial
http://onsemi.com
MARKING
DIAGRAM
8
1
SO8
D SUFFIX
CASE 751
8
V8460A
ALYW
G
1
V8460A = Specific Device Code
A = Assembly Location
L = Wafer Lot
Y = Year
W = Work Week
G = PbFree Package
PIN CONNECTIONS
GND 1
IN 2
STAT 3
NC 4
8 VD
7 OUT
6 OUT
5 VD
(Top View)
ORDERING INFORMATION
Device
Package
Shipping
NCV8460ADR2G SOIC8 2500 / Tape & Reel
(PbFree)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2012
August, 2012 Rev. 1
1
Publication Order Number:
NCV8460/D
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NCV8460A pdf
NCV8460A
ELECTRICAL CHARACTERISTICS (8 VD 36 V; 40°C < TJ < 150°C unless otherwise specified)
Value
Rating
Symbol
Conditions
Min Typ Max Unit
DIAGNOSTICS CHARACTERISTICS
Openload On State Detection
Threshold
IOL1
Vin = 5 V, TJ > 25°C
30 300 mA
Openload On State Detection
Threshold
IOL2
Vin = 5 V, TJ < 25°C
30 350 mA
Openload On State Detection
Delay
td_OL_on
Iout = 0 A
220 ms
Openload Off State Detection
Threshold
VOL
Vin = 0 V
1.5 3.5 V
Openload Detection Delay at
Turn Off
td_OL_off
1000
ms
3. Not subjected to production testing
4. To ensure long term reliability under heavy overload or short circuit conditions, protection and related diagnostic signals must be used
together with a proper hardware/software strategy. If the devices operates under abnormal conditions this hardware/software solutions
must limit the duration and number of activation cycles.
Iout < IOL
VIN Vout > VOL
VIN TJ > TJ_TSD
VSTAT
Td_OL_off
Td_OL_on
Figure 2. Open Load Status Timing
(with external pullup)
Vout
80%
dVout / dt(on)
td(on)
Vin
VSTAT
http://www.DataSheet4U.net/
Td_STAT
Td_STAT
Figure 3. Overtemperature Status Timing
10%
td(off)
90%
dVout / dt(off)
t
Figure 4. Switching Timing Diagram
t
http://onsemi.com
5
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NCV8460A arduino
NCV8460A
TYPICAL CHARACTERISTICS CURVES
1000
25°C
150°C
100
ISO 76372:2004(E)
Test Pulse
1
2a
3a
3b
4
5 (Load Dump)
10
10
L (mH)
100
Figure 29. SinglePulse Maximum Switchoff
Current vs. Load Inductance
ISO 76372: 2004(E) PULSE TEST RESULTS
Test Levels
I II III IV
g
g
75 V
100 V
g
g
+37 V
+50 V
g
g
112 V
150 V
g
g
+75 V
+100 V
g g 6 V 7 Vhttp://www.DataSheet4U.net/
g
g
+65 V
+87 V
Delays and
Impedance
2 ms, 10 W
0.05 ms, 10 W
0.1 ms, 50 W
0.1 ms, 50 W
5 s, .01 W
400 ms, 2 W
ISO 76372:2004(E)
Test Pulse
1
2a
3a
3b
4
5 (Load Dump)
Test Results
I II III IV
CC
CC
CC
CC
AA
CE
Class
A
B
C
D
E
Functional Status
All functions of a device perform as designed during and after exposure to disturbance.
All functions of a device perform as designed during exposure. However,one or more of
them can go beyond specified tolerance. All functions return automatically to within normal
limits after exposure is removed. Memory functions shall remain class A.
One or more functions of a device do not perform as designed during exposure but return
automatically to normal operation after exposure is removed.
One or more functions of a device do not perform as designed during exposure and do not return to normal operation until
exposure is removed and the device is reset by simple
One or more functions of a device do not perform as designed during and after exposure and cannot be returned to proper
operation without replacing the device.
http://onsemi.com
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