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Hamamatsu - Back-thinned CCD image sensors

Numéro de référence S11155-2048
Description Back-thinned CCD image sensors
Fabricant Hamamatsu 
Logo Hamamatsu 





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S11155-2048 fiche technique
CCD linear image sensors
S11155-2048 S11156-2048
Back-thinned CCD image sensors with
electronic shutter function
The S11155-2048 and S11156-2048 are back-thinned CCD linear image sensors with an internal electronic shutter for spec-
trometers. These image sensors use a resistive gate structure that allows high-speed transfer. Each pixel has a lengthwise size
needed by spectrometers but ensures readout with low image lag.
Features
Built-in electronic shutter
Minimum integration time: 30 μs
High sensitivity from the ultraviolet region
(spectral response range: 200 to 1100 nm)
Readout speed: 10 MHz max.
Image lag: 0.1% typ.
Applications
Spectrometers
Image readout
General ratings
Parameter
Pixel size
Number of total pixels
Number of active pixels
Active area
Horizontal clock phase
Output circuit
Package
Window*1
S11155-2048
S11156-2048
14 (H) × 500 (V) μm
14 (H) × 1000 (V) μm
2068 (H) × 1 (V)
2048 (H) × 1 (V)
28.672 (H) × 0.500 (V) mm
28.672 (H) × 1.000 (V) mm
2-phase
Two-stage MOSFET source follower
24-pin ceramic DIP (refer to dimensional outline)
Quartz glass
*1: Temporary window type (ex. S11155-2048N) is available upon request.
Resistive gate structure
In ordinary CCDs, one pixel contains multiple
electrodes and a signal charge is transferred by
applying different clock pulses to those elec-
trodes [Figure 1]. In resistive gate structures,
a single high-resistance electrode is formed in
the active area, and a signal charge is trans-
ferred by means of a potential slope that is
created by applying different voltages across
wwwta.DhreeaaetaliemScahtrgoeedeets4e[UnFsig.ocurorewmh2i]c.hCiosmupsaerdedastoa
a CCD
linear
sensor by line binning, a one-dimensional CCD
having a resistive gate structure in the active
area offers higher speed transfer, allowing
readout with low image lag even if the pixel
height is large.
[Figure 1] Schematic diagram and potential
of ordinary 2-phase CCD
P1V P2V P1V P2V
N- N N- N N- N N- N
P
[Figure 2] Schematic diagram and potential
of resistive gate structure
REGL
REGH STG TG
Resistive gate
P+ N N- N
P
KMPDC0320EA
Potential slope
KMPDC0321EB
www.hamamatsu.com
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