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ACE24C08 Datasheet دیتاشیت PDF دانلود

دیتاشیت - ACE Technology - Two-wire Serial EEPROM

شماره قطعه ACE24C08
شرح مفصل Two-wire Serial EEPROM
تولید کننده ACE Technology 
آرم ACE Technology 


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ACE24C08 شرح
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ACE24(L)C02/04/08/16                                                                                                                               
                                              Technology
Two-wire Serial EEPROM
Description
The ACE24(L)C02/04/08/16 provides 2048 / 4096 / 8192 / 16384 bits of serial electrically erasable and
programmable read-only memory (EEPROM) organized as 256/512/1024/2048 words of 8 bits each. The device is
optimized for use in many industrial and commercial applications where low-power and low-voltage
operations are essential.
Features
z Low Operation Voltage:
ACE24C02/04/08/16 : Vcc=2.2V to 5.5V
ACE24LC02/04/08/16 : Vcc=1.7V to 3.6V
z Internally Organized: 266x/(2K), 512x8(4K), 1024x8(8K) or 204/x8(16K)
z Two-wire Serial Interface
z Schmitt Trigger, Filtered Inputs for Noise Suppression
z Bi-directional Data Transfer Protocol
z ACE24C02/04/08/16 :100kHz(2.2V) and 400kHz(5V) Compatibility
ACE24LC02/04/08/16 :1MHz (3.6V,2.7V,2.5V) and 400 kHz (1.7V) Compatibility
z Write Protect Pin for Hardware Data Protection
z 8-byte Page(02), 16-byte Page (04,08,16) Write Modes
z Partial Page Writes are Allowed
z Self-timed Write Cycle (5 ms max)
z High-reliability - Endurance: 1,000,000 Write Cycles
- Data Retention: 100 Years
z PDIP-8,SOP-8,TSSOP-8 ROHS compliant Packages
z Wafer Sales: available in inked wafer Form
Absolute Maximum Ratings
Operating Temperature
Storage Temperature
-55to +125
-65to +150
Voltage on Any Pin with Respect to Ground
-1.0V to +7.0V
Maximum Operating Voltage ACE24(L)C02/04/08/16
6.25V
DC Output Current
5.0 mA
*Notice: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational
sections of this specification are not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
VER 1.3 1 

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