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PDF M24L16161DA Data sheet ( Hoja de datos )

Número de pieza M24L16161DA
Descripción 16-Mbit (1M x 16) Pseudo Static RAM
Fabricantes Elite Semiconductor Memory Technology 
Logotipo Elite Semiconductor Memory Technology Logotipo



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No Preview Available ! M24L16161DA Hoja de datos, Descripción, Manual

ESMT
Revision History :
Revision 1.0 (Jul. 4, 2007)
- Original
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M24L16161DA
Elite Semiconductor Memory Technology Inc.
Publication Date : Jul. 2007
Revision : 1.0
1/12

1 page




M24L16161DA pdf
ESMT
AC Test Loads and Waveforms
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M24L16161DA
Parameters
R1
R2
RTH
VTH
3.0V VCC
26000
26000
13000
1.50
Unit
V
Switching Characteristics Over the Operating Range[9, 10, 11, 14, 15]
Parameter
Read Cycle
tRC[13]
tCD
tAA
tOHA
tACE
tDOE
tLZOE
tHZOE
tLZCE
tHZCE
tDBE
tLZBE
tHZBE
Description
Read Cycle Time
Chip Deselect Time CE1 =HIGH or CE2=LOW,
BLE / BHE High Pulse Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low Z[10, 11, 12]
OE HIGH to High Z[10, 11, 12]
CE LOW to Low Z[10, 11, 12]
CE HIGH to High Z[10, 11, 12]
BLE / BHE LOW to Data Valid
BLE / BHE LOW to Low Z[10, 11, 12]
BLE / BHE HIGH to High Z[10, 11, 12]
Min.
70
15
5
5
10
5
-70
Max.
40000
70
70
35
25
25
70
25
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes:
9. Test conditions for all parameters other than tri-state parameters assume signal transition time of 1 ns/V, timing reference
levels of VCC(typ.)/2, input pulse levels of 0V to VCC, and output loading of the specified IOL/IOH as shown in the “AC Test Loads
and Waveforms” section.
10. At any given temperature and voltage conditions tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and
tHZWE is less than tLZWE for any given device. All low-Z parameters will be measured with a load capacitance of 30 pF (3V).
11. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high-impedance state.
12. High-Z and Low-Z parameters are characterized and are not 100% tested.
13 .If invalid address signals shorter than min. tRC are continuously repeated for 40 µs, the device needs a normal read timing
(tRC) or needs to enter standby state at least once in every 40 µs.
14. In order to achieve 70-ns performance, the read access must be Chip Enable ( CE1 or CE2) controlled. That is, the
addresses must be stable prior to Chip Enable going active.
Elite Semiconductor Memory Technology Inc.
Publication Date : Jul. 2007
Revision : 1.0
5/12

5 Page





M24L16161DA arduino
ESMT
Ordering Information
Speed (ns) Ordering Code
70 M24L16161DA -70BIG
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M24L16161DA
Package Type
48-ball Very Fine Pitch BGA (6 x 8 x 1 mm) (Pb-Free)
Operating Range
Industrial
Package Diagrams
48-ball VFBGA (6 x 8 x 1 mm)
Elite Semiconductor Memory Technology Inc.
Publication Date : Jul. 2007
Revision : 1.0
11/12

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