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PDF TC55VBM316AFTN Data sheet ( Hoja de datos )

Número de pieza TC55VBM316AFTN
Descripción MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
Fabricantes Toshiba Semiconductor 
Logotipo Toshiba Semiconductor Logotipo



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No Preview Available ! TC55VBM316AFTN Hoja de datos, Descripción, Manual

TC55VBM316AFTN/ASTN40,55
www.DaTtaESNheTeAt4TUI.VcoEm TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
524,288-WORD BY 16-BIT/1,048,576-WORD BY 8-BIT FULL CMOS STATIC RAM
DESCRIPTION
The TC55VBM316AFTN/ASTN is a 8,388,608-bit static random access memory (SRAM) organized as 524,288
words by 16 bits/1,048,576 words by 8 bits. Fabricated using Toshiba's CMOS Silicon gate process technology, this
device operates from a single 2.3 to 3.6 V power supply. Advanced circuit technology provides both high speed and
low power at an operating current of 3 mA/MHz and a minimum cycle time of 40 ns. It is automatically placed in
low-power mode at 0.7 µA standby current (at VDD = 3 V, Ta = 25°C, typical) when chip enable ( CE1 ) is asserted
high or (CE2) is asserted low. There are three control inputs. CE1 and CE2 are used to select the device and for
data retention control, and output enable ( OE ) provides fast memory access. Data byte control pin ( LB , UB )
provides lower and upper byte access. This device is well suited to various microprocessor system applications
where high speed, low power and battery backup are required. And, with a guaranteed operating extreme
temperature range of 40° to 85°C, the TC55VBM316AFTN/ASTN can be used in environments exhibiting extreme
temperature conditions. The TC55VBM316AFTN/ASTN is available in a plastic 48-pin thin-small-outline package
(TSOP).
FEATURES
Low-power dissipation
Operating: 9 mW/MHz (typical)
Single power supply voltage of 2.3 to 3.6 V
Power down features using CE1 and CE2
Data retention supply voltage of 1.5 to 3.6 V
Direct TTL compatibility for all inputs and outputs
Wide operating temperature range of 40° to 85°C
Standby Current (maximum):
3.6 V
3.0 V
10 µA
5 µA
PIN ASSIGNMENT (TOP VIEW)
48 PIN TSOP
1 48
24 25
(Normal)
Access Times (maximum):
TC55VBM316AFTN/ASTN
40 55
Access Time
40 ns
55 ns
CE1 Access Time
40 ns
55 ns
CE2 Access Time
40 ns
55 ns
OE Access Time
25 ns
30 ns
Package:
TSOP 48-P-1220-0.50 (AFTN) (Weight:0.51 g typ)
TSOP 48-P-1214-0.50 (ASTN) (Weight:0.36 g typ)
PIN NAMES
A0~A18
A-1~A18
CE1 , CE2
R/W
OE
LB , UB
I/O1~I/O16
BYTE
VDD
GND
NC
OP*
Address Inputs (Word Mode)
Address Inputs (Byte Mode)
Chip Enable
Read/Write Control
Output Enable
Data Byte Control
Data Inputs/Outputs
Byte (×8 mode) Enable
Power
Ground
No Connection
Option
*: OP pin must be open or connected to GND.
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
A15 A14 A13 A12 A11 A10 A9 A8 NC NC R/W CE2 OP UB LB A18
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
A17 A7 A6 A5 A4 A3 A2 A1 A0 CE1 GND OE I/O1 I/O9 I/O2 I/O10
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48
I/O3 I/O11
I/O4 I/O12 VDD
I/O5
I/O13 I/O6 I/O14 I/O7
I/O15 I/O8
I/O16 GND
/A-1
BYTE
A16
2002-08-05 1/15

1 page




TC55VBM316AFTN pdf
TC55VBM316AFTN/ASTN40,55
www.DaAtaCSheCetH4UA.cRomACTERISTICS AND OPERATING CONDITIONS
(Ta = −40° to 85°C, VDD = 2.7 to 3.6 V)
READ CYCLE
SYMBOL
PARAMETER
tRC
tACC
tCO1
tCO2
tOE
tBA
tCOE
tOEE
tBE
tOD
tODO
tBD
tOH
Read Cycle Time
Address Access Time
Chip Enable( CE1 ) Access Time
Chip Enable(CE2) Access Time
Output Enable Access Time
Data Byte Control Access Time
Chip Enable Low to Output Active
Output Enable Low to Output Active
Data Byte Control Low to Output Active
Chip Enable High to Output High-Z
Output Enable High to Output High-Z
Data Byte Control High to Output High-Z
Output Data Hold Time
TC55VBM316AFTN/ASTN
40 55
MIN MAX MIN MAX
40 55
40 55
40 55
40 55
25 30
40 55
55
00
55
20 25
20 25
20 25
10 10
UNIT
ns
WRITE CYCLE
TC55VBM316AFTN/ASTN
SYMBOL
PARAMETER
40 55 UNIT
MIN MAX MIN MAX
tWC Write Cycle Time
40 55
tWP Write Pulse Width
30 40
tCW Chip Enable to End of Write
35 45
tBW Data Byte Control to End of Write
35 45
tAS Address Setup Time
tWR Write Recovery Time
00
ns
00
tODW
R/W Low to Output High-Z
20 25
tOEW
R/W High to Output Active
00
tDS Data Setup Time
20 25
tDH Data Hold Time
00
Note: tOD, tODO, tBD and tODW are specified in time when an output becomes high impedance, and are not judged depending on
an output voltage level.
2002-08-05 5/15

5 Page





TC55VBM316AFTN arduino
TC55VBM316AFTN/ASTN40,55
www.DaDtaSAhTeeAt4UR.cEomTENTION CHARACTERISTICS (Ta = −40° to 85°C)
SYMBOL
PARAMETER
VDH
IDDS2
tCDR
tR
Data Retention Supply Voltage
Standby Current
VDH = 3.6 V Ta = −40~85°C
Ta = −40~40°C
VDH = 3.0 V
Ta = −40~85°C
Chip Deselect to Data Retention Mode Time
Recovery Time
MIN
1.5
0
5
TYP
MAX
3.6
10
2
5
UNIT
V
µA
ns
ms
CE1 CONTROLLED DATA RETENTION MODE (See Note 1)
VDD
VDD
2.3 V
DATA RETENTION MODE
VIH
CE1
(See Note 2)
tCDR
VDD 0.2 V
GND
CE2 CONTROLLED DATA RETENTION MODE (See Note 3)
VDD
VDD
DATA RETENTION MODE
2.3 V
CE2
VIH
tCDR
VIL 0.2 V
GND
UB , LB CONTROLLED DATA RETENTION MODE (See Note 4)
VDD
VDD
2.3 V
DATA RETENTION MODE
(See Note 2)
tR
tR
VIH
UB , LB
GND
(See Note 5)
tCDR
VDD 0.2 V
(See Note 5)
tR
2002-08-05 11/15

11 Page







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