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PDF LCP1521DEE Data sheet ( Hoja de datos )
| Número de pieza | LCP1521DEE | |
| Descripción | (LCP1521S/DEE) Programmable transient voltage suppressor | |
| Fabricantes | STMicroelectronics | |
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LCP1521S/LCP152DEE
ASD (Application Specific Devices)
Programmable transient voltage suppressor for SLIC protection
Features
■ Dual programmable transient suppressor
■ Wide negative firing voltage range:
VMGL = -150 V max.
■ Low dynamic switching voltages:
VFP and VDGL
■ Low gate triggering current: IGT = 5 mA max
■ Peak pulse current: IPP = 30 A (10/1000 µs)
■ Holding current: IH = 150 mA min
■ Low space consuming package
Description
www.DataSheet4U.com
These devices have been especially designed
to protect new high voltage, as well as classical
SLICs, against transient overvoltages.
Positive overvoltages are clamped by 2 diodes.
Negative surges are suppressed by 2 thyristors,
their breakdown voltage being referenced to -VBAT
through the gate.
These components present a very low gate
triggering current (IGT) in order to reduce the
current consumption on printed circuit board
during the firing phase.
Benefits
TRISILs™ are not subject to ageing and provide a
fail safe mode in short circuit for a better level of
protection. Trisils are used to ensure equipment
meets various standards such as UL60950,
IEC950 / CSA C22.2, UL1459 and FCC part 68.
Trisils have UL94 V0 approved resin (Trisils are
UL497B approved [file: E136224]).
SO-8
LCP1521S
QFN 3x3 6 leads
LCP152DEE
Order codes
Part Number
LCP1521S
LCP1521SRL
LCP152DEERL
Marking
CP152S
CP152S
LCP152
Figure 1. LCP1521S Functional diagram
TIP 1
GATE
NC
RING
TIP
GND
GND
RING
Figure 2. LCP152DEE Functional diagram
TIP
GATE
GND
TIP
NC
TM: TRISIL is a trademark of STMicroelectronics
RING
RING
July 2006
Rev 5
1/11
www.st.com
11
1 page  
LCP1521S/LCP152DEE
Characteristics
Figure 3.
Functional Holding Current (IH) test circuit: GO-NO GO test
R
Surge generator
VBAT = - 100V
D.U.T
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE:
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current: IPP = 10A, 10/1000µs
- The D.U.T. will come back to the off-state within a duration of 50ms max.
Figure 4.
Test circuit for VFP and VDGL parameters
(V is defined in unload condition)
P
L
R2
R4
VP C1
R3
R1 C2
TIP
R ING
G ND
Pulse (µs) Vp C1 C2 L R1 R2 R3 R4 IPP Rs
tr tp (V) (µF) (nF) (µH) (Ω) (Ω) (Ω) (Ω) (A) (Ω)
10 700 1500 20 200
0
50 15 25 25 30 10
1.2 50 1500 1 33 0 76 13 25 25 30 10
2 10 2500 10 0 1.1 1.3 0 3 3 38 62
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5 Page 
LCP1521S/LCP152DEE
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| PDF Descargar | [ Datasheet LCP1521DEE.PDF ] | |
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