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PDF HI5767 Data sheet ( Hoja de datos )

Número de pieza HI5767
Descripción A/D Converter
Fabricantes Intersil Corporation 
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®
Data Sheet
March 30, 2005
HI5767
FN4319.6
10-Bit, 20/40/60MSPS A/D Converter with
Internal Voltage Reference
The HI5767 is a monolithic, 10-bit, analog-to-digital
converter fabricated in a CMOS process. It is designed for
high speed applications where wide bandwidth and low
power consumption are essential. Its high sample clock
rate is made possible by a fully differential pipelined
architecture with both an internal sample and hold and
internal band-gap voltage reference.
The 250MHz Full Power Input Bandwidth and superior high
frequency performance of the HI5767 converter make it an
excellent choice for implementing Digital IF architectures in
communications applications.
The HI5767 has excellent dynamic performance while
consuming only 310mW power at 40MSPS. Data output
latches are provided which present valid data to the output
bus with a latency of 7 clock cycles.
The HI5767 is offered in 20MSPS, 40MSPS and 60MSPS
sampling rates.
Pinout
www.DataSheet4U.com
HI5767 (SOIC, SSOP)
TOP VIEW
DVCC1 1
DGND 2
DVCC1 3
DGND 4
AVCC 5
AGND 6
VREFIN 7
VREFOUT 8
VIN+ 9
VIN- 10
VDC 11
AGND 12
AVCC 13
OE 14
28 D0
27 D1
26 D2
25 D3
24 D4
23 DVCC2
22 CLK
21 DGND
20 D5
19 D6
18 D7
17 D8
16 D9
15 DFS
Features
• Sampling Rate . . . . . . . . . . . . . . . . . . . . . . 20/40/60MSPS
• 8.8 Bits at fIN = 10MHz, fS = 40MSPS
• Low Power at 40MSPS . . . . . . . . . . . . . . . . . . . . .310mW
• Wide Full Power Input Bandwidth . . . . . . . . . . . . 250MHz
• On-Chip Sample and Hold
• Internal 2.5V Band-Gap Voltage Reference
• Fully Differential or Single-Ended Analog Input
• Single Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . .+5V
• TTL/CMOS Compatible Digital Inputs
• CMOS Compatible Digital Outputs. . . . . . . . . . . 3.0V/5.0V
• Offset Binary or Two’s Complement Output Format
• Pb-Free Available (RoHS Compliant)
Applications
• Digital Communication Systems
• QAM Demodulators
• Professional Video Digitizing
• Medical Imaging
• High Speed Data Acquisition
1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2003, 2005. All Rights Reserved
All other trademarks mentioned are the property of their respective owners.

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HI5767 pdf
HI5767
Absolute Maximum Ratings TA = 25oC
Supply Voltage, AVCC or DVCC to AGND or DGND . . . . . . . . . . .6V
DGND to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3V
Digital I/O Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DGND to DVCC
Analog I/O Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . AGND to AVCC
Operating Conditions
Temperature Range
HI5767/xCx. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0oC to 70oC
HI5767/xIx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
Thermal Information
Thermal Resistance (Typical, Note 1)
θJA (oC/W)
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
75
SSOP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . .
100
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
AVCC = DVCC1 = 5.0V, DVCC2 = 3.0V; VREFIN = VREFOUT; fS = 40MSPS at 50% Duty Cycle;
CL = 10pF; TA = 25oC; Differential Analog Input; Typical Values are Test Results at 25oC,
Unless Otherwise Specified
PARAMETER
TEST CONDITIONS
MIN TYP MAX
ACCURACY
Resolution
10 -
-
Integral Linearity Error, INL
Differential Linearity Error, DNL
(Guaranteed No Missing Codes)
fIN = 1MHz Sinewave
fIN = 1MHz Sinewave
-
±0.75
±1.75
-
±0.35
±1.0
Offset Error, VOS
Full Scale Error, FSE
DYNAMIC CHARACTERISTICS
fIN = DC
fIN = DC
-40 - 40
-4-
Minimum Conversion Rate
No Missing Codes
- 0.5 1
Maximum Conversion Rate
HI5767/2
No Missing Codes
20 -
-
HI5767/4
No Missing Codes
40 -
-
HI5767/6
No Missing Codes
60 -
-
Effective Number of Bits, ENOB
HI5767/2
HI5767/4
HI5767/6
Signal to Noise and Distortion Ratio, SINAD
= ----------------R----M-----S------S----i-g----n---a---l---------------
RMS Noise + Distortion
HI5767/2
HI5767/4
HI5767/6
Signal to Noise Ratio, SNR
= R-----M-----S------S----i-g---n----a---l
RMS Noise
HI5767/2
HI5767/4
HI5767/6
Total Harmonic Distortion, THD
HI5767/2
fS = 20MSPS, fIN = 10MHz
fS = 40MSPS, fIN = 10MHz
fS = 60MSPS, fIN = 10MHz
fS = 20MSPS, fIN = 10MHz
fS = 40MSPS, fIN = 10MHz
fS = 60MSPS, fIN = 10MHz
fS = 20MSPS, fIN = 10MHz
fS = 40MSPS, fIN = 10MHz
fS = 60MSPS, fIN = 10MHz
fS = 20MSPS, fIN = 10MHz
8.7
8.55
8.1
9
8.8
8.4
-
-
-
- 55.9 -
- 54.7 -
- 53.8 -
- 55.9 -
- 55 -
- 54 -
- -71 -
UNITS
Bits
LSB
LSB
LSB
LSB
MSPS
MSPS
MSPS
MSPS
Bits
Bits
Bits
dB
dB
dB
dB
dB
dB
dBc
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HI5767 arduino
HI5767
TABLE 1. A/D CODE TABLE
OFFSET BINARY OUTPUT CODE
(DFS LOW)
TWO’S COMPLEMENT OUTPUT CODE
(DFS HIGH)
CODE CENTER
DESCRIPTION
M LM L
DIFFERENTIAL S
INPUT VOLTAGE B
SS
BB
S
B
(VIN+ - VIN-) D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
+Full Scale (+FS) -
1/4 LSB
+FS - 11/4 LSB
+3/4 LSB
-1/4 LSB
-FS + 13/4 LSB
0.499756V
0.498779V
732.422µV
-244.141µV
-0.498291V
11111111110111111111
11111111100111111110
10000000000000000000
01111111111111111111
00000000011000000001
-Full Scale (-FS) +
3/4 LSB
-0.499268V
00000000001000000000
NOTE:
4. The voltages listed above represent the ideal center of each output code shown with VREFIN = +2.5V.
Detailed Description
Theory of Operation
The HI5767 is a 10-bit fully differential sampling pipeline A/D
converter with digital error correction logic. Figure 16 depicts
the circuit for the front end differential-in-differential-out sample-
and-hold (S/H). The switches are controlled by an internal
sampling clock which is a non-overlapping two phase signal, Φ1
and Φ2, derived from the master sampling clock. During the
sampling phase, Φ1, the input signal is applied to the sampling
capacitors, CS. At the same time the holding capacitors, CH,
are discharged to analog ground. At the falling edge of Φ1 the
input signal is sampled on the bottom plates of the sampling
capacitors. In the next clock phase, Φ2, the two bottom plates
of the sampling capacitors are connected together and the
holding capacitors are switched to the op-amp output nodes.
The charge then redistributes between CS and CH completing
one sample-and-hold cycle. The front end sample-and-hold
output is a fully-differential, sampled-data representation of the
analog input. The circuit not only performs the sample-and-hold
function but will also convert a single-ended input to a fully-
differential output for the converter core. During the sampling
phase, the VIN pins see only the on-resistance of a switch and
CS. The relatively small values of these components result in a
typical full power input bandwidth of 250MHz for the converter.
As illustrated in the functional block diagram and the timing
diagram in Figure 1, eight identical pipeline subconverter
stages, each containing a two-bit flash converter and a two-
bit multiplying digital-to-analog converter, follow the S/H
circuit with the ninth stage being a two bit flash converter.
Each converter stage in the pipeline will be sampling in one
phase and amplifying in the other clock phase. Each
individual subconverter clock signal is offset by 180 degrees
from the previous stage clock signal resulting in alternate
stages in the pipeline performing the same operation.
The output of each of the eight identical two-bit subconverter
stages is a two-bit digital word containing a supplementary bit
to be used by the digital error correction logic. The output of
each subconverter stage is input to a digital delay line which is
controlled by the internal sampling clock. The function of the
digital delay line is to time align the digital outputs of the eight
identical two-bit subconverter stages with the corresponding
output of the ninth stage flash converter before applying the
eighteen bit result to the digital error correction logic. The
digital error correction logic uses the supplementary bits to
correct any error that may exist before generating the final ten
bit digital data output of the converter.
Because of the pipeline nature of this converter, the digital data
representing an analog input sample is output to the digital data
bus on the 7th cycle of the clock after the analog sample is
taken. This time delay is specified as the data latency. After the
data latency time, the digital data representing each
succeeding analog sample is output during the following clock
cycle. The digital output data is synchronized to the external
sampling clock by a double buffered latching technique. The
digital output data is available in two’s complement or offset
binary format depending on the state of the Data Format Select
(DFS) control input (see Table 1, A/D Code Table).
Internal Reference Voltage Output, VREFOUT
The HI5767 is equipped with an internal reference voltage
generator, therefore, no external reference voltage is
required. VREFOUT must be connected to VREFIN when using
the internal reference voltage.
An internal band-gap reference voltage followed by an
amplifier/buffer generates the precision +2.5V reference
voltage used by the converter. A 4:1 array of substrate
PNPs generates the “delta-VBE” and a two-stage op-amp
closes the loop to create an internal +1.25V band-gap
reference voltage. This voltage is then amplified by a
wideband uncompensated operational amplifier connected
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