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PDF IRHNA597260 Data sheet ( Hoja de datos )

Número de pieza IRHNA597260
Descripción (IRHNA593260 / IRHNA597260) RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-2)
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PD - 94168A
RADIATION HARDENED
POWER MOSFET
SURFACE MOUNT (SMD-2)
Product Summary
Part Number Radiation Level
IRHNA597260 100K Rads (Si)
IRHNA593260 300K Rads (Si)
RDS(on) ID
0.102-35.5A
0.102-35.5A
IRHNA597260
200V, P-CHANNEL
4# TECHNOLOGY
c
International Rectifier’s R5TM technology provides
high performance power MOSFETs for space appli-
cations. These devices have been characterized for
Single Event Effects (SEE) with useful performance
up to an LET of 80 (MeV/(mg/cm2)). The combination
of low RDS(on) and low gate charge reduces the power
losses in switching applications such as DC to DC
converters and motor control. These devices retain
all of the well established advantages of MOSFETs
such as voltage control, fast switching, ease of paral-
leling and temperature stability of electrical param-
eters.
Absolute Maximum Ratings
Parameter
ID @ VGS = -12V, TC = 25°C Continuous Drain Current
ID @ VGS = -12V, TC = 100°C Continuous Drain Current
IDM Pulsed Drain Current
PD @ TC = 25°C
Max. Power Dissipation
Linear Derating Factor
VGS
EAS
IAR
EAR
dv/dt
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
TJ
TSTG
Operating Junction
Storage Temperature Range
Pckg. Mounting Surface Temp.
Weight
SMD-2
Features:
n Single Event Effect (SEE) Hardened
n Ultra Low RDS(on)
n Low Total Gate Charge
n Proton Tolerant
n Simple Drive Requirements
n Ease of Paralleling
n Hermetically Sealed
n Surface Mount
n Ceramic Package
n Light Weight
Pre-Irradiation
Units
-35.5
-22.5
A
-142
300 W
2.4 W/°C
±20 V
320 mJ
-35.5
A
30 mJ
10
-55 to 150
V/ns
oC
300 ( for 5s )
3.3 ( Typical )
g
For footnotes refer to the last page
www.irf.com
1
08/07/01
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Pre-Irradiation
IRHNA597260
10000
8000
6000
VGS = 0V, f = 1MHz
Ciss = Cgs + Cgd , Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
Ciss
4000
2000
0
1
Crss
Coss
10 100
-VDS , Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
20 ID = -35.5A
16
12
VDS =-160V
VDS =-100V
VDS =-40V
8
4
FOR TEST CIRCUIT
SEE FIGURE 13
0
0 50 100 150 200 250
QG , Total Gate Charge (nC)
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
100
TJ = 150° C
10
TJ = 25 ° C
1
0.1
0.0
VGS = 0 V
1.5 3.0 4.5
-VSD ,Source-to-Drain Voltage (V)
6.0
Fig 7. Typical Source-Drain Diode
Forward Voltage
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1000
100
OPERATION IN THIS AREA
LIMITED BY RDS(on)
10
Tc = 25°C
Tj = 150°C
Single Pulse
1
1 10
1ms
10ms
100 1000
-VDS , Drain-toSource Voltage (V)
Fig 8. Maximum Safe Operating Area
5
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