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PDF HYMD564646CP6 Data sheet ( Hoja de datos )

Número de pieza HYMD564646CP6
Descripción 184Pin Unbuffered DDR SDRAM DIMMs
Fabricantes Hynix 
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184pin Unbuffered DDR SDRAM DIMMs based on 512Mb C ver. (TSOP)
This Hynix unbuffered Dual In-Line Memory Module (DIMM) series consists of 512Mb C ver. DDR SDRAMs in 400mil
TSOP II packages on a 184pin glass-epoxy substrate. This Hynix 512Mb C ver. based unbuffered DIMM series provide
a high performance 8 byte interface in 5.25" width form factor of industry standard. It is suitable for easy interchange
and addition.
FEATURES
• JEDEC Standard 184-pin dual in-line memory module
(DIMM)
• Two ranks 128M x 72, 128M x 64 and One rank 64M
x 72, 64M x 64, 32M x 64 organization
• 2.6V ± 0.1V VDD and VDDQ Power supply for
DDR400, 2.5V ± 0.2V for DDR333 and below
• All inputs and outputs are compatible with SSTL_2
interface
• Fully differential clock operations (CK & /CK) with
133/166/200MHz
• DLL aligns DQ and DQS transition with CK transition
• Programmable CAS Latency: DDR266(2, 2.5 clock),
DDR333(2.5 clock), DDR400(3 clock)
• Programmable Burst Length 2 / 4 / 8 with both
sequential and interleave mode
• Edge-aligned DQS with data outs and Center-aligned
DQS with data inputs
• Auto refresh and self refresh supported
• 8192 refresh cycles / 64ms
• Serial Presence Detect (SPD) with EEPROM
• Built with 512Mb DDR SDRAMs in 400 mil TSOP II
packages
• All lead-free products (RoHS compliant)
ADDRESS TABLE
Organization Ranks
256MB
512MB
512MB
1GB
1GB
32M x 64
64M x 64
64M x 72
128M x 64
128M x 72
1
1
1
2
2
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SDRAMs
32Mb x 16
64Mb x 8
64Mb x 8
64Mb x 8
64Mb x 8
# of
DRAMs
4
8
9
16
18
# of row/bank/column Address
13(A0~A12)/2(BA0,BA1)/10(A0~A9)
13(A0~A12)/2(BA0,BA1)/11(A0~A9,A11)
13(A0~A12)/2(BA0,BA1)/11(A0~A9,A11)
13(A0~A12)/2(BA0,BA1)/11(A0~A9,A11)
13(A0~A12)/2(BA0,BA1)/11(A0~A9,A11)
PERFORMANCE RANGE
Part-Number Suffix
Speed Bin
CL - tRCD- tRP
Max Clock
Frequency
CL=3
CL=2.5
CL=2
-D431
DDR400B
3-3-3
200
166
133
-J
DDR333
2.5-3-3
-
166
133
-H
DDR266B
2.5-3-3
-
133
133
Refresh
Method
8K / 64ms
8K / 64ms
8K / 64ms
8K / 64ms
8K / 64ms
Unit
-
CK
MHz
MHz
MHz
Note:
1. 2.6V ± 0.1V VDD and VDDQ Power supply for DDR400 and 2.5V ± 0.2V for DDR333 and below
DataShee
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev. 1.2 / Nov. 2005
1
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11
184pin Unbuffered DDR SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
512MB, 64M x 64 Unbuffered DIMM: HYMD564646CP8[J]
DQS0
DM0/DQS9
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
/CS0
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D0
DQS4
DM4/DQS13
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D4
DQS1
DM1/DQS10
DDQQ89
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D1
DQS5
DM5/DQS14
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D5
DQS2
DM2/DQS11
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D2
DQS6
DM6/DQS15
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DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D6
DQS3
DM3/DQS12
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D3
DQS7
DM7/DQS16
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DM
I/O7
I/O6
I/O1
I/O0
I/O5
I/O4
I/O3
I/O2
/CS DQS
D7
SCL
Serial PD
W
P
A0 A1 A2
SA0 SA1 SA2
VDD SPD
SDA VDD /VDDQ
VREF
VSS
VDDID
BA0-BA1
A0-A13
/RAS
/CAS
CKE0
/WE
BA0-BA1 : SDRAMs D0-D7
A0-A13 : SDRAMs D0-D7
/RAS : SDRAMs D0-D7
/CAS : SDRAMs D0-D7
CKE : SDRAMs D0-D7
/WE : SDRAMs D0-D7
SPD
DO-D7
*Clock Wiring
Clock Input
SDRAMs
DO-D7
DO-D7
*CK0, /CK0
*CK1, /CK1
*CK2, /CK2
2 SDRAMs
3 SDRAMs
3 SDRAMs
Strap:see Note 4
*Wire per Clock Loading
Table/Wiring Diagrams
Notes :
1. DQ-to-I/O wiring is shown as recommended but
may be changed.
2. DQ/DQS/DM/CKE/S relationships must be
maintained as shown.
3. DQ, DQS, DM/DQS resistors : 22 Ohms +- 5%.
4. VDDID strap connections
(for memory device VDD, VDDQ):
STRAP OUT (OPEN) : VDD = VDDQ
STRAP IN (VSS) : VDD V DDQ
5. BAx, Ax, RAS, CAS, WE resistors : 5.1 Ohms +- 5%
DataShee
Rev. 1.2 / Nov. 2005
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HYMD564646CP6 arduino
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184pin Unbuffered DDR SDRAM DIMMs
IDD SPECIFICATION AND CONDITIONS (TA=0 to 70oC, Voltage referenced to VSS = 0V)
512MB, 64M x 64 Unbuffered DIMM: HYMD564646CP8[J]
Symbol
IDD0
IDD1
IDD2P
IDD2F
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
IDD6
IDD7
Test Condition
DDR400B
One bank; Active - Precharge; tRC=tRC(min);
tCK=tCK(min); DQ,DM and DQS inputs changing twice per
clock cycle; address and control inputs changing once per
clock cycle
1040
One bank; Active - Read - Precharge; Burst Length=2;
tRC=tRC(min); tCK=tCK(min); address and control inputs
changing once per clock cycle
1360
All banks idle; Power down mode; CKE=Low, tCK=tCK(min)
/CS=High, All banks idle; tCK=tCK(min); CKE= High;
address and control inputs changing once per clock cycle.
VIN=VREF for DQ, DQS and DM
One bank active ; Power down mode; CKE=Low,
tCK=tCK(min)
/CS=HIGH; CKE=HIGH; One bank; Active-Precharge;
tRC=tRAS(max); tCK=tCK(min); DQ, DM and DQS inputs
changing twice per clock cycle; Address and other control
inputs changing once per clock cycle
Burst=2; Reads; Continuous burst; One bank active;
Address and control inputs changing once per clock cycle;
tCK=tCK(min); IOUT=0mA
1680
Burst=2; Writes; Continuous burst; One bank active;
Address and control inputs changing once per clock cycle;
tCK=tCK(min); DQ, DM and DQS inputs changing twice per
1840
clock cycle
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tRC=tRFC(min) - 8*tCK for DDR200 at 100Mhz, 10*tCK for
DDR266A & DDR266B at 133Mhz; distributed refresh
2080
CKE=<0.2V; External clock on; tCK
=tCK(min)
Normal
Low Power
Four bank interleaving with BL=4 Refer to the following
page for detailed test condition
2880
Speed
DDR333
960
1200
80
280
360
480
1520
1680
1920
40
20
2800
DDR266B
800
960
1360
1440
1760
2720
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
Note
DataShee
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
Rev. 1.2 / Nov. 2005
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