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PDF ICX424AL Data sheet ( Hoja de datos )
| Número de pieza | ICX424AL | |
| Descripción | Diagonal 6mm (Type 1/3) Progressive Scan CCD Solid-state Image Sensor | |
| Fabricantes | Sony | |
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ICX424AL
Diagonal 6mm (Type 1/3) Progressive Scan CCD Solid-state Image Sensor with Square Pixel for B/W Cameras
Description
The ICX424AL is a diagonal 6mm (Type 1/3) interline
CCD solid-state image sensor with a square pixel
array suitable for EIA black-and-white cameras.
Progressive scan allows all pixel's signals to be output
independently within approximately 1/60 second. This
chip features an electronic shutter with variable
charge-storage time which makes it possible to
realize full-frame still images without a mechanical
shutter. High sensitivity and low dark current are
achieved through the adoption of the HAD (Hole-
Accumulation Diode) sensors.
This chip is suitable for applications such as FA
and surveillance cameras.
16 pin DIP (Plastic)
Features
• Progressive scan allows individual readout of the image signals
from all pixels.
• High vertical resolution (480 TV-lines) still images without a
mechanical shutter
• Square pixel
• Supports VGA format
• Horizontal drive frequency: 24.54MHz
• No voltage adjustments (reset gate and substrate bias are not
adjusted.)
• High resolution, high sensitivity, low dark current
• Continuous variable-speed shutter
• Low smear
• Excellent anti-blooming characteristics
• Horizontal register: 5.0V drive
• 16-pin high precision plastic package (enables dual-surface standard)
Pin 1
2
V
2
Pin 9
H
8
31
Optical black position
(Top View)
Device Structure
• Interline CCD image sensor
• Image size:
Diagonal 6mm (Type 1/3)
• Number of effective pixels: 659 (H) × 494 (V) approx. 330K pixels
• Total number of pixels: 692 (H) × 504 (V) approx. 350K pixels
• Chip size:
5.79mm (H) × 4.89mm (V)
• Unit cell size:
7.4µm (H) × 7.4µm (V)
• Optical black:
Horizontal (H) direction: Front 2 pixels, rear 31 pixels
Vertical (V) direction: Front 8 pixels, rear 2 pixels
• Number of dummy bits: Horizontal 16
Vertical 5
• Substrate material:
Silicon
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
–1–
E01Z09B35
1 page  
ICX424AL
Clock Equivalent Circuit Constants
Item Symbol Min. Typ. Max. Unit Remarks
CφV1
3900
pF
Capacitance between vertical transfer clock and GND CφV2
3300
pF
CφV3
3300
pF
CφV12
1000
pF
Capacitance between vertical transfer clocks
CφV23
1000
pF
CφV31
1000
pF
Capacitance between horizontal transfer clock and GND CφH1, CφH2
47
pF
Capacitance between horizontal transfer clocks
CφHH
30 pF
Capacitance between reset gate clock and GND
CφRG
6 pF
Capacitance between substrate clock and GND
CφSUB
560 pF
Vertical transfer clock series resistor
R1, R2
R3
33 Ω
18 Ω
Vertical transfer clock ground resistor
RGND
100 Ω
Horizontal transfer clock series resistor
RφH1, RφH2
10
Ω
Reset gate clock series resistor
RφRG
39 Ω
Vφ1 R1
CφV12
R2 Vφ2
CφV1 CφV2
RGND
CφV31
CφV3
CφV23
R3
Vφ3
Vertical transfer clock equivalent circuit
RφH1
Hφ1
CφH1
CφHH
RφH2
Hφ2
CφH2
Horizontal transfer clock equivalent circuit
φRG
RφRG
CφRG
Reset gate clock equivalent circuit
–5–
5 Page 
ICX424AL
Image Sensor Characteristics Measurement Method
Measurement conditions
(1) In the following measurements, the device drive conditions are at the typical values of the bias and clock
voltage conditions.
(2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical
black level (OB) is used as the reference for the signal output, which is taken as the value measured at
point [∗B] of the measurement system.
Definition of standard imaging conditions
(1) Standard imaging condition I:
Use a pattern box (luminance: 706cd/m2, color temperature of 3200K halogen source) as a subject.
(Pattern for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0mm) as an IR
cut filter and image at F8. The luminous intensity to the sensor receiving surface at this point is defined as
the standard sensitivity testing luminous intensity.
(2) Standard imaging condition II:
Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles.
Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter. The luminous intensity is adjusted
to the value indicated in each testing item by the lens diaphragm.
1. Sensitivity
Set to standard imaging condition I. After setting the electronic shutter mode with a shutter speed of
1/250s, measure the signal voltage (Vs) at the center of the screen, and substitute the value into the
following formula.
S = Vs ×
250
30
[mV]
2. Saturation signal
Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with the
average value of the signal output, 150mV, measure the minimum value of the signal output.
3. Smear
Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, first adjust the luminous intensity
to 500 times the intensity with the average value of signal output, 150mV. Then after the readout clock is
stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure
the maximum value (VSm [mV]) of the signal output and substitute the value into the following formula.
Sm = 20 × log VSm × 1 × 1 [dB] (1/10V method conversion value)
150 500 10
4. Video signal shading
Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity so
that the average value of the signal output is 150mV. Then measure the maximum (Vmax [mV]) and
minimum (Vmin [mV]) values of the signal output and substitute the values into the following formula.
SH = (Vmax – Vmin)/150 × 100 [%]
5. Dark signal
Measure the average value of the signal output (Vdt [mV]) with the device ambient temperature 60°C and
the device in the light-obstructed state, using the horizontal idle transfer level as a reference.
– 11 –
11 Page | ||
| Páginas | Total 29 Páginas | |
| PDF Descargar | [ Datasheet ICX424AL.PDF ] | |
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