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PDF 74F541 Data sheet ( Hoja de datos )
| Número de pieza | 74F541 | |
| Descripción | Octal inverter buffer 3- State | |
| Fabricantes | Philips | |
| Logotipo |  |
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INTEGRATED CIRCUITS
74F540
Octal inverter buffer (3- State)
74F541
Octal buffer (3- State)
Product specification
IC15 Data Handbook
1990 Jan 08
Philips
Semiconductors
1 page  
Philips Semiconductors
Buffers
Product specification
74F540, 74F541
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
VOH High-level output voltage
VOL Low-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –3mA
IOH = –15mA
IOL = MAX
±10%VCC
±5%VCC
±10%VCC
±5%VCC
±10%VCC
±5%VCC
2.4
2.7
2.0
2.0
3.4
0.55
0.42 0.55
V
V
V
V
V
V
VIK Input clamp voltage
II
Input current at maximum input
voltage
VCC = MIN, II = IIK
VCC = 0.0V, VI = 7.0V
–0.73
–1.2
100
V
µA
IIH
IIL
IOZH
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
20 µA
–20 µA
50 µA
IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50 µA
IOS Short-circuit output currentNO TAG
VCC = MAX
–100
–225
mA
ICCH
In=OEn=GND
22 30
mA
74F540 ICCL
In=4.5V, OEn=GND
58 75
mA
ICC
Supply current
(total)
ICCZ
ICCH
VCC = MAX
In=GND, OEn=4.5V
In=4.5V, OEn=GND
40 55
30 40
mA
mA
74F541 ICCL
In=OEn=GND
55 72
mA
ICCZ
In=GND, OEn=4.5V
45 58
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS should be performed last.
1990 Jan 08
5
5 Page | ||
| Páginas | Total 10 Páginas | |
| PDF Descargar | [ Datasheet 74F541.PDF ] | |
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