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Número de pieza SAA4952WP
Descripción Memory controller
Fabricantes Philips 
Logotipo Philips Logotipo



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No Preview Available ! SAA4952WP Hoja de datos, Descripción, Manual

INTEGRATED CIRCUITS
DATA SHEET
SAA4952WP
Memory controller
Objective specification
File under Integrated Circuits, IC02
1997 Jun 10

1 page




SAA4952WP pdf
Philips Semiconductors
Memory controller
Objective specification
SAA4952WP
SYMBOL
TEST
SSC
RSTW1
LLD
VSS4
PIN
40
41
42
43
44
I/O DESCRIPTION
I test input
I select single clock system input
O reset write signal output (memory 1)
I line-locked clock signal input (display part)
ground 4
handbook, full pagewidth
IE1 7
WE1 8
STROBE 9
VDD2 10
HRA/BLNA 11
VSS1 12
LLA 13
IE2 14
WE2 15
CLV 16
HVCD 17
SAA4952WP
39 VACQ
38 VDFL
37 HDFL
36 VDD4
35 HRDFL
34 VSS3
33 LLDFL
32 P7
31 P6
30 P5
29 P4
MHA723
1997 Jun 10
Fig.2 Pin configuration.
5

5 Page





SAA4952WP arduino
Philips Semiconductors
Memory controller
Objective specification
SAA4952WP
Table 4 Horizontal acquisition related pulses
ADDRESS
(HEX)
58
59
5A
5B
5C
5D
5E
REGISTER
FUNCTION
CLVSTA
CLVSTO
HWE1STA
HWE1STO
HAMSBDEL
HVACQS1
HVACQS2
start of clamp pulse
stop of clamp pulse
start of horizontal write enable 1 (lower 8 of 9 bits)
stop of horizontal write enable 1 (lower 8 of 9 bits)
bit 0: MSB of HWE1STA
bit 1: MSB of HWE1STO
bit 2: fine delay of HWE1 (LSB)
bit 3: fine delay of HWE1 (MSB)
bit 4: PWC05: Phase of Write Clock SWC05, determines the phase relationship of
SWC05 towards BLNA or HRA
bit 5: SFR: Select Field Recognition mode
bit 6: FRD: Field Recognition Disabled (FRD = 1)
bit 7: don’t care
VACQ sample pulse 1
VACQ sample pulse 2
Table 5 Mode registers
ADDRESS
(HEX)
60
61
REGISTER
MODE0
MODE1
mode register 0; see Table 7
mode register 1; see Table 10
FUNCTION
Table 6 Read registers
ADDRESS
(HEX)
81
80
REGISTER
FUNCTION
FIELDINF2
FIELDINF1
bit 0: bit 8 of field length measurement
bit 1: bit 9 of field length measurement (MSB)
bit 2: LSB of display field count
bit 3: field recognition for incoming source
bit 4: MSB of display field count
result of field length measurement (lower 8 of 10 bits)
1997 Jun 10
11

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