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Número de pieza | N74F253D | |
Descripción | Dual 4-bit input multiplexer 3-State | |
Fabricantes | Philips | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de N74F253D (archivo pdf) en la parte inferior de esta página. Total 10 Páginas | ||
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74F253
Dual 4-bit input multiplexer (3-State)
Product specification
IC15 Data Handbook
1988 Nov 29
Philips
Semiconductors
1 page Philips Semiconductors
Dual 4-input multiplexer (3-State)
Product specification
74F253
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
VOH High-level output voltage
VCC = MIN, VIL = MAX,
VIH = MIN, IOH = MAX
VOL Low-level output voltage
VCC = MIN, VIL = MAX,
VIH = MIN, IOL = MAX
VIK Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input
voltage
VCC = MAX, VI = 7.0V
±10%VCC 2.4
±5%VCC 2.7
3.3
±10%VCC
0.35 0.50
±5%VCC
0.35 0.50
–0.73 –1.2
100
V
V
V
V
V
µA
IIH
IIL
IOZH
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
20 µA
–0.6 mA
50 µA
IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO= 0.5V
–50 µA
IOS
Short-circuit output currentNO TAG
VCC = MAX
–60 –150 mA
ICCH
OEn=GND, Sn=In=4.5V
10 16 mA
ICC
Supply current (total) ICCL
VCC = MAX
OEn=Sn=In=GND
12 23 mA
ICCZ
OEn=4.5V, Sn=In=GND
14 23 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1988 Nov 29
5
5 Page |
Páginas | Total 10 Páginas | |
PDF Descargar | [ Datasheet N74F253D.PDF ] |
Número de pieza | Descripción | Fabricantes |
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