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PDF HYM361140S-70 Data sheet ( Hoja de datos )

Número de pieza HYM361140S-70
Descripción 1M x 36-Bit Dynamic RAM Module (2M x 18-Bit Dynamic RAM Module)
Fabricantes Siemens 
Logotipo Siemens Logotipo



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No Preview Available ! HYM361140S-70 Hoja de datos, Descripción, Manual

1M × 36-Bit Dynamic RAM Module
(2M × 18-Bit Dynamic RAM Module)
HYM 361120/40S/GS-60/-70
Advanced Information
1 048 576 words by 36-bit organization
(alternative 2 097 152 words by 18-bit)
Fast access and cycle time
60 ns access time
110 ns cycle time (-60 version)
70 ns access time
130 ns cycle time (-70 version)
Fast page mode capability with
40 ns cycle time (-60 version)
45 ns cycle time (-70 version)
Single + 5 V (± 10 %) supply
Low power dissipation
max. 6820 mW active (-60 version)
max. 6160 mW active (-70 version)
CMOS – 66 mW standby
TTL – 132 mW standby
CAS-before-RAS refresh, RAS-only-refresh,
Hidden refresh
12 decoupling capacitors mounted on
substrate
All inputs, outputs and clock fully TTL
compatible
72 pin Single in-Line Memory Module
Utilizes four 1M × 1-DRAMs and eight
1M × 4-DRAMs in 300 mil SOJ packages
1024 refresh cycles/16 ms
Tin-Lead contact pads (S - version)
Gold contact pads (GS - version)
HYM 321140S: single sided module with
31.75 mm (1250 mil) height
HYM 321120S: double sided module with
25.40 mm (1000 mil) height
Ordering Information
Type
HYM 361140S-60
HYM 361140S-70
HYM 361120S-60
HYM 361120S-70
HYM 361140GS-60
HYM 361140GS-70
HYM 361120GS-60
HYM 361120GS-70
Ordering Code
Q67100-Q959
Q67100-Q958
Q67100-Q942
Q67100-Q741
Q67100-Q1019
Q67100-Q651
Q67100-Q961
Q67100-Q960
Package
L-SIM-72-8
L-SIM-72-8
L-SIM-72-3
L-SIM-72-3
L-SIM-72-8
L-SIM-72-8
L-SIM-72-3
L-SIM-72-3
Descriptions
DRAM module (access time 60 ns)
DRAM module (access time 70 ns)
DRAM module (access time 60 ns)
DRAM module (access time 70 ns)
DRAM module (access time 60 ns)
DRAM module (access time 70 ns)
DRAM module (access time 60 ns)
DRAM module (access time 70 ns)
Semiconductor Group
591
06.94

1 page




HYM361140S-70 pdf
HYM 361120/40S/GS-60/-70
1M × 36-Bit
Absolute Maximum Ratings
Operating temperature range ......................................................................................... 0 to + 70 ˚C
Storage temperature range...................................................................................... – 55 to + 125 ˚C
Soldering temperature ............................................................................................................ 260 ˚C
Soldering time ............................................................................................................................. 10 s
Input/output voltage ........................................................................................................ – 1 to + 7 V
Power supply voltage...................................................................................................... – 1 to + 7 V
Power dissipation................................................................................................................... 8.68 W
Data out current (short circuit) ................................................................................................ 50 mA
Note: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent
damage to the device. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
DC Characteristics 1)
TA = 0 to 70 ˚C; VCC = 5 V ± 10 %
Parameter
Symbol
Input high voltage
VIH
Input low voltage
VIL
Output high voltage (IOUT = – 5 mA)
VOH
Output low voltage (IOUT = 4.2 mA)
VOL
Input leakage current
(0 V < VIN < 6.5 V, all other pins = 0 V)
II(L)
Output leakage current
(DO is disabled, 0 V < VOUT < 5.5 V)
IO(L)
Average VCC supply current:
ICC1
-60 version
-70 version
Limit Values
min.
max.
2.4 5.5
– 1.0
0.8
2.4 –
– 0.4
– 20 20
– 10 10
– 1240
– 1120
(RAS, CAS, address cycling, tRC = tRC min.)
Standby VCC supply current
(RAS = CAS = VIH)
ICC2
Average VCC supply current during RAS
only refresh cycles:
ICC3
-60 version
-70 version
24
1240
1120
(RAS cycling, CAS = VIH , tRC = tRC min.)
Unit Test
Condition
V–
V–
V–
V–
µA –
µA –
mA 2), 3)
mA
mA –
2)
mA
mA
Semiconductor Group
595

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