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TC7SZ32AFE Datasheet دیتاشیت PDF دانلود

دیتاشیت - Toshiba - 2 INPUT OR GATE

شماره قطعه TC7SZ32AFE
شرح مفصل 2 INPUT OR GATE
تولید کننده Toshiba 
آرم Toshiba 


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TC7SZ32AFE شرح
TC7SZ32AFE
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7SZ32AFE
2 Input OR Gate
Features
High output drive: ±24 mA (typ.)
@VCC = 3 V
Super high speed operation: tPD 2.4 ns (typ.)
@VCC = 5 V, 50 pF
Operation voltage range: VCC (opr) = 1.8~5.5 V
Supply voltage data retention: VCC = 1.5~5.5 V
Latch-up performance: ±500 mA
ESD performance: Human body model > ±2000 V
Machine model > ±200 V
Weight: 0.003 g (typ.)
Power down protection is provided on all inputs.
Matches the performance of TC74LCX series when operated at 3.3 V VCC
Input rise and fall time (tr, tf) (recommended operation condition)
@VCC = 1.8 V, 2.5 V ± 0.2 V: 0~20 ns/V
@VCC = 3.3 V ± 0.3 V: 0~10 ns/V
@VCC = 5.5 V ± 0.5 V: 0~5 ns/V
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC VCC/ground current
Power dissipation
Storage temperature
Lead temperature (10 s)
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Tstg
TL
0.5~6
0.5~6
0.5~VCC + 0.5
±20
±20
±50
±50
150
65~150
260
V
V
V
mA
mA
mA
mA
mW
°C
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
1 2007-11-01

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