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UPD17P218 fiches techniques PDF

NEC - 4-BIT SINGLE-CHIP MICROCONTROLLER FOR INFRARED REMOTE CONTROLLER

Numéro de référence UPD17P218
Description 4-BIT SINGLE-CHIP MICROCONTROLLER FOR INFRARED REMOTE CONTROLLER
Fabricant NEC 
Logo NEC 





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UPD17P218 fiche technique
DATA SHEET
MOS INTEGRATED CIRCUIT
µPD17P218
4-BIT SINGLE-CHIP MICROCONTROLLER
FOR INFRARED REMOTE CONTROLLER
DESCRIPTION
The µPD17P218 is a model of the µPD17218 with a one-time PROM instead of an internal mask ROM.
5
Since the user can write programs to the µPD17P218, it is ideal for experimental production or small-scale
production of the µPD17215, 17216, 17217 or 17218 systems.
When reading this document, also read the documents related to the µPD17215, 17216, 17217 and 17218.
Detailed functions are described in the following user’s manual. Read this manual when designing your
system.
µPD172×× Series User’s Manual: IEU-1317
FEATURES
• Pin compatible with µPD17215, 17216, 17217 and 17218 (except PROM programming function)
• Carrier generator circuit for infrared remote controller (REM output)
• 17K architecture: General-purpose register method
• Program memory (one-time PROM): 16K bytes (8192 × 16)
• Data memory (RAM): 223 × 4 bits
• Pull-up resistor can be connected to RESET pinNote.
• Low-voltage detection circuit (WDOUT output)Note
• Operating voltage range: 2.0 to 5.5 V (fx = 4 MHz: normal mode, 8 µs)
2.2 to 5.5 V (fx = 4 MHz: high-speed mode, 4 µs)
3.5 to 5.5 V (fx = 8 MHz: high-speed mode, 2 µs)
Note: Can be selected by mask option with the mask model.
APPLICATIONS
Preset remote controllers, toys, and portable systems
ORDERING INFORMATION
Part Number
µPD17P218GT
µPD17P218CT
Package
28-pin plastic SOP (375 mil)
28-pin plastic shrink DIP (400 mil)
Quality Grade
Standard
Standard
Please refer to “Quality Grade on NEC Semiconductor Devices” (Document number IEI-1209) published by NEC
Corporation to know the specification of quality grade on the devices and its recommended applications.
Document No. IC - 3252
(O. D. No. IC - 8797)
Date Published September 1994 P
Printed in Japan
The information in this document is subject to change without notice.
The mark 5 shows major revised points.
© 1994

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