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Numéro de référence | SCAN18374T | ||
Description | D Flip-Flop with TRI-STATE Outputs | ||
Fabricant | National Semiconductor | ||
Logo | |||
1 Page
September 1998
SCAN18374T
D Flip-Flop with TRI-STATE® Outputs
General Description
The SCAN18374T is a high speed, low-power D-type
flip-flop featuring separate D-type inputs organized into dual
9-bit bytes with byte-oriented clock and output enable control
signals. This device is compliant with IEEE 1149.1 Standard
Test Access Port and BOUNDARY-SCAN Architecture with
the incorporation of the defined BOUNDARY-SCAN test
logic and test access port consisting of Test Data Input (TDI),
Test Data Out (TDO), Test Mode Select (TMS), and Test
Clock (TCK).
Features
n IEEE 1149.1 (JTAG) Compliant
n Buffered positive edge-triggered clock
n TRI-STATE outputs for bus-oriented applications
n 9-bit data busses for parity applications
n Reduced-swing outputs source 24 mA/sink 48 mA (Mil)
n Guaranteed to drive 50Ω transmission line to TTL input
levels of 0.8V and 2.0V
n TTL compatible inputs
n 25 mil pitch Cerpack packaging
n Includes CLAMP and HIGHZ instructions
n Standard Microcircuit Drawing (SMD) 5962-9320701
Connection Diagram
Pin Names
AOE1, BOE1
AO(0–8), BO(0–8)
Description
TRI-STATE Output Enable Inputs
TRI-STATE Outputs
DS100322-1
Pin Names
AI(0–8), BI(0–8)
ACP, BCP
Description
Data Inputs
Clock Pulse Inputs
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 1998 National Semiconductor Corporation DS100322
www.national.com
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Pages | Pages 14 | ||
Télécharger | [ SCAN18374T ] |
No | Description détaillée | Fabricant |
SCAN18374T | D Flip-Flop with TRI-STATE Outputs | National Semiconductor |
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