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K7R163684B-FC25 fiches techniques PDF

Samsung semiconductor - 512Kx36 & 1Mx18 QDR II b4 SRAM

Numéro de référence K7R163684B-FC25
Description 512Kx36 & 1Mx18 QDR II b4 SRAM
Fabricant Samsung semiconductor 
Logo Samsung semiconductor 





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K7R163684B-FC25 fiche technique
K7R163684B
K7R161884B
512Kx36 & 1Mx18 QDRTM II b4 SRAM
Document Title
512Kx36-bit,1Mx18-bit QDRTM II b4 SRAM
Revision History
Rev. No.
History
0.0 1. Initial document.
0.1 1. Change the Boundary scan exit order.
2. Correct the Overshoot and Undershoot timing diagram.
0.2 1. Change JTAG Block diagram
0.3 1. Add the speed bin (-25)
0.4 1. Correct the JTAG ID register definition
2. Correct the AC timing parameter (delete the tKHKH Max value)
0.5 1. Change the Maximum Clock cycle time.
2. Correct the 165FBGA package ball size.
0.6 1. Add the power up/down sequencing comment.
2. Update the DC current parameter (Icc and Isb).
3. Change the Max. speed bin from -33 to -30.
0.7 1. Change the ISB1.
Speed Bin
-30
-25
-20
-16
From
200
180
160
140
To
230
210
190
170
1.0 1. Final spec release
2.0 1. Delete the x8 Org.
2. Delete the 300MHz speed bin
3.0 1. Add the 300MHz speed bin
3.1 1. Change the stand-by current(ISB1)
before after
Isb1 -30 : 230
260
-25 : 210
240
-20 : 190
220
-16 : 170
200
Draft Date
Oct. 17. 2002
Dec. 16, 2002
Remark
Advance
Preliminary
Dec. 26, 2002
Jan. 27, 2003
Mar. 20, 2003
Preliminary
Preliminary
Preliminary
April. 4, 2003
Preliminary
June. 20, 2003
Preliminary
Oct. 20. 2003
Preliminary
Oct. 31, 2003
Nov. 28, 2003
Final
Final
June. 18, 2004
July. 28, 2004
Final
Final
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
- 1 - July. 2004
Rev 3.1

PagesPages 18
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