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PDF IDT71V256 Data sheet ( Hoja de datos )

Número de pieza IDT71V256
Descripción 3.3V CMOS FAST SRAM WITH 2.5V COMPATIBLE INPUTS 256K (32K x 8-BIT)
Fabricantes Integrated Device Technology 
Logotipo Integrated Device Technology Logotipo



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Integrated Device Technology, Inc.
LOW POWER
3.3V CMOS FAST SRAM
256K (32K x 8-BIT)
IDT71V256SA
FEATURES
• Ideal for high-performance processor secondary cache
• Commercial (0° to 70°C) and Industrial (-40° to 85°C)
temperature options
• Fast access times:
— Commercial: 10/12/15/20ns
— Industrial: 15ns
• Low standby current (maximum):
— 2mA full standby
• Small packages for space-efficient layouts:
— 28-pin 300 mil SOJ
— 28-pin 300 mil plastic DIP (Commercial only)
— 28-pin TSOP Type I
• Produced with advanced high-performance CMOS
technology
• Inputs and outputs are LVTTL-compatible
• Single 3.3V(±0.3V) power supply
DESCRIPTION
The IDT71V256SA is a 262,144-bit high-speed static RAM
organized as 32K x 8. It is fabricated using IDT’s high-
performance, high-reliability CMOS technology.
The IDT71V256SA has outstanding low power character-
istics while at the same time maintaining very high perfor-
mance. Address access times of as fast as10 ns are ideal for
3.3V secondary cache in 3.3V desktop designs.
When power management logic puts the IDT71V256SA in
standby mode, its very low power characteristics contribute to
extended battery life. By taking CS HIGH, the SRAM will
automatically go to a low power standby mode and will remain
in standby as long as CS remains HIGH. Furthermore, under
full standby mode (CS at CMOS level, f=0), power consump-
tion is guaranteed to always be less than 6.6mW and typically
will be much smaller.
The IDT71V256SA is packaged in 28-pin 300 mil SOJ, 28-
pin 300 mil plastic DIP, and 28-pin 300 mil TSOP Type I
packaging.
FUNCTIONAL BLOCK DIAGRAM
A0
ADDRESS
DECODER
A14
I/O0
INPUT
DATA
CIRCUIT
I/O7
CS
OE CONTROL
WE CIRCUIT
262,144 BIT
MEMORY ARRAY
I/O CONTROL
VCC
GND
3101 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL AND COMMERCIAL TEMPERATURE RANGES
©1997 Integrated Device Technology, Inc.
MAY 1997
DSC-3101/04
1

1 page




IDT71V256 pdf
IDT71V256SA
3.3V CMOS STATIC RAM 256K (32K x 8-BIT)
TIMING WAVEFORM OF READ CYCLE NO. 2(1, 2, 4)
t RC
ADDRESS
DATAOUT
tAA
t OH
PREVIOUS DATA VALID
TIMING WAVEFORM OF READ CYCLE NO. 3(1, 3, 4)
CS
DATAOUT
t ACS
tCLZ (5)
NOTES:
1. WE is HIGH for Read cycle.
2. Device is continuously selected, CS is LOW.
3. Address valid prior to or coincident with CS transition LOW.
4. OE is LOW.
5. Transition is measured ±200mV from steady state.
INDUSTRIAL AND COMMERCIAL TEMPERATURE RANGES
tOH
DATA VALID
3101 drw 07
DATA VALID
t CHZ (5)
3101 drw 08
TIMING WAVEFORM OF WRITE CYCLE NO. 1 (WE CONTROLLED TIMING)(1, 2, 3, 5, 7)
t WC
ADDRESS
tOHZ (6)
OE
t AW
CS
t AS
tWP (7)
t WR
WE
DATAOUT
DATAIN
t WHZ (6)
(4)
tOW (6)
t DW
t DH
DATA VALID
(4)
3101 drw 09
NOTES:
1. WE or CS must be HIGH during all address transitions.
2. A write occurs during the overlap of a LOW CS and a LOW WE.
3. tWR is measured from the earlier of CS or WE going HIGH to the end of the write cycle.
4. During this period, I/O pins are in the output state so that the input signals must not be applied.
5. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state.
6. Transition is measured ±200mV from steady state.
7. If OE is LOW during a WE controlled write cycle, the write pulse width must be the larger of tWP or (tWHZ + tDW) to allow the I/O drivers to turn off and data
to be placed on the bus for the required tDW. If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the write pulse can
be as short as the spectified tWP.
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