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PDF HY51V18163HGJ-7 Data sheet ( Hoja de datos )

Número de pieza HY51V18163HGJ-7
Descripción 1M x 16Bit EDO DRAM
Fabricantes Hynix Semiconductor 
Logotipo Hynix Semiconductor Logotipo



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HY51V(S)18163HG/HGL
1M x 16Bit EDO DRAM
PRELIMINARY
DESCRIPTION
The HY51V(S)18163HG/HGL is the new generation dynamic RAM organized 1,048,576 words x 16bit.
HY51V(S)18163HG/HGL has realized higher density, higher performance and various functions by utiliz-
ing advanced CMOS process technology. The HY51V(S)18163HG/HGL offers Extended Data Out Page-
Mode as a high speed access mode. Multiplexed address inputs permit the HY51V(S)18163HG/HGL to be
packaged in standard 400mil 42pin SOJ and 44(50) pin TSOP-II. The package size provides high system
bit densities and is compatible with widely available automated testing and insertion equipment.
FEATURES
• Extended Data Out Mode capability
• Read-modify-write capability
• Multi-bit parallel test capability
• TTL(3.3V) compatible inputs and outputs
• /RAS only, CAS-before-/RAS, Hidden and self
refresh(L-version) capability
Fast access time and cycle time
• JEDEC standard pinout
• 42pin plastic SOJ / 44(50)pin TSOP-II (400mil)
• Single power supply of 3.3V +/- 0.3V
• Battery back up operation(L-version)
• 2CAS byte control
Part No
HY51V(S)18163HG/HGL-5
HY51V(S)18163HG/HGL-6
HY51V(S)18163HG/HGL-7
tRAC
50ns
60ns
70ns
tCAC
13ns
15ns
18ns
tRC
84ns
104ns
124ns
tHPC
20ns
25ns
30ns
• Power dissipation
Active
Standby
50ns
60ns
70ns
684mW
612mW
540mW
7.2mW(CMOS level Max)
0.83mW (L-version : Max)
ORDERING INFORMATION
Refresh cycle
Part No
HY51V18163HG
HY51V18163HGL
Ref Normal L-part
1K 16ms
1K 128ms
Part Number
HY51V(S)18163HGJ/HG(L)J-5
HY51V(S)18163HGJ/HG(L)J-6
HY51V(S)18163HGJ/HG(L)J-7
HY51V(S)18163HGT/HG(L)T-5
HY51V(S)18163HGT/HG(L)T-6
HY51V(S)18163HGT/HG(L)T-7
(S) : Self refresh,
(L) : Low power
Access Time
50ns
60ns
70ns
50ns
60ns
70ns
Package
400mil 42pin SOJ
400mil 44(50)pin TSOP-II
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev.0.1/Apr.01

1 page




HY51V18163HGJ-7 pdf
HY51V(S)18163HG/HGL
DC CHARACTERISTICS (Vcc = 3.3V +/- 10%, TA=0 to 70°C)
Symbol
Parameter
VOH
Output Level
Output Level voltage(Iout= -2mA)
VOL
Output Level
Output Level voltage(Iout=2mA)
ICC1
Operating current
Average power supply operating current
( /RAS, /CAS Cycling : tRC = tRC min)
50ns
60ns
70ns
ICC2
Standby current (TTL interface)
Power supply standby current
(/RAS, /CAS=VIH, Dout = High-Z)
ICC3
/RAS only refresh current
Average power supply current
/RAS only refresh mode
(tRC= tRC min)
50ns
60ns
70ns
ICC4
EDO page mode current
Average power supply current
EDO page mode (tPC=tPC min)
50ns
60ns
70ns
CMOS interface ( /RAS, /CAS >= Vcc-0.2V, Dout = High-Z)
ICC5
Standby current ( L-version)
50ns
ICC6 /CAS-before-/RAS refresh current (tRC=tRC min)
60ns
70ns
ICC7
Battery back up operating current ( standby with CBR ref.)
(CBR refresh, tRC=31.3us, tRAS <= 0.3us, Dout = High-Z, CMOS interface)
ICC8
Standby current
(RAS=VIH, /CAS=VIL, Dout=Enable)
ICC9
Self refresh current
(/RAS, /CAS <=0.2V, Dout=High-Z)
II(L) Input leakage current, Any input (0V<= Vin<=4.6V)
IO(L) Output leakage current, (Dout is disabled, 0V<= Vout<=4.6V)
Min Max Unit
2.4 Vcc
V
0 0.4 V
- 190
- 170 mA
- 150
- 2 mA
- 190
- 170 mA
- 150
- 185
- 165 mA
- 145
- 1 mA
- 150 uA
- 190
- 170 mA
- 150
- 400 uA
- 5 mA
- 250 uA
-10 10 uA
-10 10 uA
Note :
1. Icc depends on output load condition when the device is selected, Icc(max) is specified at the output open condition
2. Address can be changed once or less while /RAS=VIL
3. Address can be changed once or less while /CAS=VIH
4. /CAS = L (<=0.2) while /RAS=L (<=0.2)
5. L-Version
Note
1, 2
2
1, 3
5
4, 5
1
5
Rev.0.1/Apr.01
5

5 Page





HY51V18163HGJ-7 arduino
HY51V(S)18163HG/HGL
17. Access time is determined by the longest among tAA or tCAC or tACP
18. In delayed write or read-modify-write cycels, OE must disable output buffer prior to applying data to the
device, After /RAS is reset, if tOEH>=tCWL, the I/O pin will remain open circuit (high impedance)
If tOEH < tCWL, invalid data will be out at each I/O
19. When both /UCAS and /LCAS go low at the same time, all 16 bit data are written into the device
/UCAS and /LCAS cannot be staggered within the same write / read cycles.
20. All the Vcc and Vss pins shall be supplied with the same voltages
21. tASC, tCAH, tRCS, tWCS, tWCH, tCSR and tRPC are determined by the earlier falling edge of /UCAS
or /LCAS.
22. tCRP, tCHR, tRCH, tACP and tCPW are determined by the later rising edge of /UCAS or /LCAS.
23. tCWL, tDH, tDS and tCSH should be satisfied by both /UCAS and /LCAS
24. tCP is determined by that time the both /UCAS and /LCAS are high.
25. tHPC(min) can be achieved during a series of EDO page mode write cycles or EDO mode write cycles
It both write and read operation are mixed in a EDO mode /RAS cycle(EDO mode mix cycle(1,2))
minimum value of /CAS cycle(tCAS+tCP+2tT) becomes greater than the specified tHPC(min) value.
The value of /CAS cycle time of mixed EDO mode is shown in EDO mode mix cycle (1) and (2)
26. When output buffers are enabled once, sustain the low impedance state until valid data is obtained
When output buffer is turned on and off within a very short time, generally it causes large Vcc/Vss line
noise, which causes to degrade VIH min / VIL max level
27. Data output turns off and becomes high impedance from later rising edge of /RAS and /CAS.
Hold time and turn off time are specified by the timing specification of later rising edge of /RAS and
/CAS between tOHR and tOH, and between tOFR and tOFF
28. EDO High-Z control by /OE or /WE. /OE rising edge disables data outputs. When /OE goes high
during /CAS high, the data will not come out until next /CAS access. When /WE goes low during
/CAS high, the data will not come out until next /CAS access
29. Please do not use tRASS timing, 10us<=tRASS<=100us. During this period, The device is in transition
state from normal operation mode to self refresh mode. If tRASS>=100us, then RAS
30. H or L ( H : VIH(min) <=VIN <= VIH(max), L : VIL(min) <= VIN <= VIL(max))
Rev.0.1/Apr.01
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