DS2740B Datasheet PDF - Dallas Semiconducotr
| Part Number | DS2740B | |
| Description | High-Precision Coulomb Counter | |
| Manufacturers | Dallas Semiconducotr | |
| Logo |  |
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FEATURES
§ 15-Bit Bidirectional Current Measurement
(DS2740)
§ 1.56mV LSB and ±51.2mV Dynamic
Range
§ 78mA LSB and ±2.56A Dynamic
Range with External 20mW Sense
Resistor (RSNS)
§ 156mA LSB and ±5.12A Dynamic
Range with External 10mW Sense
Resistor (RSNS)
§ 13-Bit Bidirectional Current Measurement
(DS2740B)
§ 6.25mV LSB and ±51.2mV Dynamic
Range
§ 312mA LSB and ±2.56A Dynamic
Range with External 20mW Sense
Resistor (RSNS)
§ 625mA LSB and ±5.12A Dynamic
Range with External 10mW Sense
Resistor (RSNS)
§ Analog Input Filter (IS1, IS2) Extends
Dynamic Range for Pulse-Load
Applications
§ Current Accumulation Register
Resolution
§ 6.25mVhr (Both DS2740 and
DS2740B)
§ 0.3125mAhr with External 20mW
RSNS
§ 0.6250mAhr with External 10mW
RSNS
§ Dallas 1-Wire® Interface
§ Unique 64-Bit Device Address
§ Standard and Overdrive Timings
(OVD)
§ Low Power Consumption:
§ Active Current: 65mA max
§ Sleep Current: 1mA max
DS2740
High-Precision Coulomb Counter
PIN CONFIGURATION
OVD 1
8 VDD
PIO 2
7 DQ
SNS
IS2
3
4
6 VSS
5 IS1
mMAX
(DS2740U, DS2740BU)
See Table 1 for Ordering Information.
See Table 2 for Detailed Pin Descriptions.
PIN DESCRIPTION
OVD- 1-Wire Bus Speed Select
PIO - Programmable I/O Pin
SNS - Sense Resistor Input
IS2 - Current-Sense Input
IS1 - Current-Sense Input
VSS - Device Ground, Current-Sense Resistor
Return
DQ - Data Input/Output
VDD - Power-Supply Input (2.7V to 5.5V)
1-Wire is a registered trademark of Dallas Semiconductor.
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DS2740
PART
DS2740
DS2740B
CONVERSION
TIME
3.515s
0.878s
CURRENT RESOLUTION (1 LSB)
VIS1 - VIS2 20mW
RSNS
15mW 10mW
5mW
1.5625mV 78.13mA 104.2mA 156.3mA 312.5mA
6.250mV 312.5mA 416.7mA 625mA 1.250mA
Every 1024th conversion, the ADC measures its input offset to facilitate offset correction. Offset
correction occurs approximately once per hour in the DS2740 and four times per hour in the DS2740B.
The resulting correction factor is applied to the subsequent 1023 measurements. During the offset
correction conversion, the ADC does not measure the IS1 to IS2 signal. A maximum error of 1/1024 in
the accumulated current register (ACR) is possible, however, to reduce the error, the current measurement
just prior to the offset conversion is displayed in the current register and is substituted for the dropped
current measurement in the current accumulation process. The typical error due to offset correction is
much less than 1/1024.
CURRENT ACCUMULATOR
Current measurements are internally summed, or accumulated, at the completion of each conversion
period with the results displayed in the ACR. The accuracy of the ACR is dependent on both the current
measurement and the conversion timebase. The ACR has a range of ±204.8mVh with an LSb of
6.25µVh. Additional registers hold fractional results of each accumulation, however, these bits are not
user accessible.
Read and write access is allowed to the ACR. Whenever the ACR is written, fractional accumulation
results are cleared. Also, a write forces the ADC to measure its offset and update the offset correction
factor. The current measurement and accumulation begin with the second conversion following a write to
the ACR. Figure 4 describes the ACR address, format, and resolution.
Figure 4. CURRENT ACCUMULATOR FORMAT
MSB—Address 10
LSB—Address 11
S 214 213
MSb
212 211 210
29 28
LSb
27 26 25 24 23 22 21 20
MSb
LSb
Units: 6.25mVh/Rsns
PART
DS2740
DS2740B
UPDATE
INTERVAL
3.515s
0.878s
VIS1- VIS2
6.25mVh
20mW
312.5mAh
ACR LSB
RSNS
15mW
10mW
416.7mAh 625mAh
5mW
1.250mAh
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| Information | Total 15 Pages | |
| Link URL | [ Copy URL to Clipboard ] | |
| Download | [ DS2740B.PDF Datasheet ] | |
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Featured Datasheets
| Part Number | Description | MFRS |
| DS2740 | The function is High-Precision Coulomb Counter. Dallas Semiconducotr | |
| DS2740B | The function is High-Precision Coulomb Counter. Dallas Semiconducotr | |
| DS2740BU | The function is High-Precision Coulomb Counter. Dallas Semiconducotr | |
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