ACS10KMSR Datasheet PDF - Intersil Corporation
| Part Number | ACS10KMSR | |
| Description | Radiation Hardened Triple Three-Input NAND Gate | |
| Manufacturers | Intersil Corporation | |
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ACS10MS
April 1995
Radiation Hardened
Triple Three-Input NAND Gate
Features
Pinouts
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose 300K RAD (Si)
• Single Event Upset (SEU) Immunity
<1 x 10-10 Errors/Bit-Day (Typ)
• SEU LET Threshold >80 MEV-cm2/mg
• Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current ≤1µA at VOL, VOH
Description
The Intersil ACS10MS is a radiation hardened triple three-input
NAND gate. A high on all inputs forces the output to a low state.
The ACS10MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of the
radiation hardened, high-speed, CMOS/SOS Logic Family.
14 LEAD CERAMIC DUAL-IN-LINE
MIL-STD-1835 DESIGNATOR CDIP2-T14, LEAD FINISH C
TOP VIEW
A1 1
B1 2
A2 3
B2 4
C2 5
Y2 6
GND 7
14 VCC
13 C1
12 Y1
11 C3
10 B3
9 A3
8 Y3
14 LEAD CERAMIC FLATPACK
MIL-STD-1835 DESIGNATOR CDFP3-F14, LEAD FINISH C
TOP VIEW
A1
B1
A2
B2
C2
Y2
GND
1 14
2 13
3 12
4 11
5 10
69
78
VCC
C1
Y1
C3
B3
A3
Y3
Ordering Information
PART NUMBER
ACS10DMSR
ACS10KMSR
ACS10D/Sample
ACS10K/Sample
ACS10HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
14 Lead SBDIP
14 Lead Ceramic Flatpack
14 Lead SBDIP
14 Lead Ceramic Flatpack
Die
Truth Table
INPUTS
OUTPUT
An Bn Cn
Yn
LLL
H
L LH
H
LHL
H
L HH
H
HL L
H
HLH
H
HH L
H
HHH
L
NOTE: L = Logic Level Low, H = Logic Level High
Functional Diagram
An
(1, 3, 9)
Bn
(2, 4, 10)
Cn
(5, 11, 13)
Yn
(6, 8, 12)
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
1
Spec Number 518814
File Number 3630
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Specifications ACS10MS
Intersil - Space Products MS Screening
Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM)
Radiation Verification (Each Wafer) Method 1019,
4 Samples/Wafer, 0 Rejects
100% Nondestructive Bond Pull Method 2023
100% Internal Visual Inspection Method 2010
100% Temperature Cycling Method 1010 Condition C
(-65o to +150oC)
100% Constant Acceleration
100% PIND Testing
100% External Visual Inspection
100% Serialization
100% Initial Electrical Test
100% Static Burn-In 1 Method 1015, 24 Hours at +125oC Min
100% Interim Electrical Test 1 (Note 1)
100% Static Burn-In 2 Method 1015, 24 Hours at +125oC Min
100% Interim Electrical Test 2 (Note 1)
100% Dynamic Burn-In Method 1015, 240 Hours at +125oC
or 180 Hours at +135oC
100% Interim Electrical Test 3 (Note 1)
100% Final Electrical Test
100% Fine and Gross Seal Method 1014
100% Radiographics Method 2012 (2 Views)
100% External Visual Method 2009
Group A (All Tests) Method 5005 (Class S)
Group B (Optional) Method 5005 (Class S) (Note 2)
Group D (Optional) Method 5005 (Class S) (Note 2)
CSI and/or GSI (Optional) (Note 2)
Data Package Generation (Note 3)
NOTES:
1. Failures from interim electrical tests 1 and 2 are combined for determining PDA (PDA = 5% for subgroups 1, 7, 9 and delta failures com-
bined, PDA = 3% for subgroup 7 failures). Interim electrical tests 3 PDA (PDA = 5% for subgroups 1, 7, 9 and delta failures combined,
PDA = 3% for subgroup 7 failures).
2. These steps are optional, and should be listed on the purchase order if required.
3. Data Package Contents:
Cover Sheet (P.O. Number, Customer Number, Lot Date Code, Intersil Number, Lot Number, Quantity).
Certificate of Conformance (as found on shipper).
Lot Serial Number Sheet (Good Unit(s) Serial Number and Lot Number).
Variables Data (All Read, Record, and delta operations).
Group A Attributes Data Summary.
Wafer Lot Acceptance Report (Method 5007) to include reproductions of SEM photos. NOTE: SEM photos to include percent of step coverage.
X-Ray Report and Film, including penetrometer measurements.
GAMMA Radiation Report with initial shipment of devices from the same wafer lot; containing a Cover Page, Disposition, RAD Dose,
Lot Number, Test Package, Spec Number(s), Test Equipment, etc. Irradiation Read and Record data will be on file at Intersil.
Propagation Delay Timing Diagram and Load Circuit
VIH
VSS
VOH
VOL
VS INPUT
TPLH
VS
TPHL
OUTPUT
DUT
CL
50pF
TEST
POINT
RL
500Ω
AC VOLTAGE LEVELS
PARAMETER
ACS
VCC
4.50
VIH 4.50
VS 2.25
VIL 0
GND
0
UNITS
V
V
V
V
V
Spec Number 518814
5
Preview 5 Page |
Part DetailsOn this page, you can learn information such as the schematic, equivalent, pinout, replacement, circuit, and manual for ACS10KMSR electronic component. |
| Information | Total 8 Pages | |
| Link URL | [ Copy URL to Clipboard ] | |
| Download | [ ACS10KMSR.PDF Datasheet ] | |
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