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PDF CD4060BMS Data sheet ( Hoja de datos )

Número de pieza CD4060BMS
Descripción CMOS 14 Stage Ripple-Carry Binary Counter/Divider and Oscillator
Fabricantes Intersil Corporation 
Logotipo Intersil Corporation Logotipo



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No Preview Available ! CD4060BMS Hoja de datos, Descripción, Manual

CD4060BMS
December 1992
CMOS 14 Stage Ripple-Carry
Binary Counter/Divider and Oscillator
Features
Pinout
• High Voltage Type (20V Rating)
• Common Reset
• 12MHz Clock Rate at 15V
• Fully Static Operation
• Buffered Inputs and Outputs
• Schmitt Trigger Input Pulse Line
• Standardized, Symmetrical Output Characteristics
• 100% Tested for Quiescent Current at 20V
Q12 1
Q13 2
Q14 3
Q6 4
Q5 5
Q7 6
Q4 7
VSS 8
• 5V, 10V and 15V Parametric Ratings
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of Functional Diagram
‘B’ Series CMOS Devices”
16 VDD
15 Q10
14 Q8
13 Q9
12 RESET
11 øI
10 ø0
9 ø0
Oscillator Features
• All Active Components on Chip
• RC or Crystal Oscillator Configuration
• RC Oscillator Frequency of 690kHz Min. at 15V
Applications
• Control counters
• Timers
• Frequency Dividers
• Time Delay Circuits
Description
CD4060BMS consists of an oscillator section and 14 ripple
carry binary counter stages. The oscillator configuration allows
design of either RC or crystal oscillator circuits. A RESET input
is provided which resets the counter to the all O’s state and dis-
ables the oscillator. A high level on the RESET line accom-
plishes the reset function. All counter stages are master slave
flip-flops. The state of the counter is advanced one step in
binary order on the negative transition of øI (and ø0). All inputs
and outputs are fully buffered. Schmitt trigger action on the
input pulse line permits unlimited input pulse rise and fall times.
The CD4060BMS is supplied in these 16 lead outline pack-
ages:
Braze Seal DIP H4W
Frit Seal DIP
H1F
Ceramic Flatpack H6W
R 12
øI 11
VSS = 8
VDD = 16
ø0 9
ø0 10
14 STAGE
RIPPLE
COUNTER
AND
OSCILLATOR
Q4
7
Q5
5
Q6
4
Q7
6
Q8
14
Q9 13
Q10
15
Q12
1
Q13
2
Q14
3
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-949
File Number 3317

1 page




CD4060BMS pdf
Specifications CD4060BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Input Capacitance
SYMBOL
CONDITIONS
CIN Any Input
NOTES
1, 2
TEMPERATURE
+25oC
MIN
-
MAX
7.5
UNITS
pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. RC Oscillator applications are not recommended at supply voltages below 7V for RX < 50k.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
Propagation Delay Time
SYMBOL
CONDITIONS
IDD VDD = 20V, VIN = VDD or GND
VNTH VDD = 10V, ISS = -10µA
VTN VDD = 10V, ISS = -10µA
VPTH
VTP
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
F
TPHL
TPLH
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
VDD = 5V
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE
+25oC
+25oC
+25oC
MIN
-
-2.8
-
1, 4
+25oC
0.2
1, 4
+25oC
-
1
1, 2, 3, 4
+25oC
+25oC
VOH >
VDD/2
-
3. See Table 2 for +25oC limit.
4. Read and Record
MAX
25
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25OC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
IDD
IOL5
IOH5A
± 1.0µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
Interim Test 3 (Post Burn-In)
PDA (Note 1)
Final Test
Group A
Group B
Subgroup B-5
Subgroup B-6
Group D
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
100% 5004
2, 3, 8A, 8B, 10, 11
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Sample 5005
1, 7, 9
Sample 5005
1, 2, 3, 8A, 8B, 9
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
7-953

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