PDF CD40257BMS Data sheet ( Hoja de datos )

Número de pieza	CD40257BMS
Descripción	CMOS Quad 2 Line to 1 Line Data Selector/Multiplexer
Fabricantes	Intersil Corporation
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No Preview Available ! CD40257BMS December 1992 CMOS Quad 2 Line to 1 Line Data Selector/Multiplexer Features Pinout • High Voltage Type (20V Rating) • 3-State Outputs CD40257BMS TOP VIEW • 100% Tested for Quiescent Current at 20V • 5V, 10V and 15V Parametric Ratings • Maximum Input Current of 1µA at 18V Over Full Pack- age Temperature Range; 100nA at 18V and +25oC • Noise Margin (Over Full Package/Temperature Range) - 1V at VDD = 5V - 2V at VDD = 10V - 2.5V at VDD = 15V • Standardized Symmetrical Output Characteristics INPUT SELECT 1 A1 2 B1 3 D1 4 A2 5 B2 6 D2 7 VSS 8 16 VDD 15 OUTPUT DISABLE 14 A4 13 B4 12 D4 11 A3 10 B3 9 D3 • Meets All Requirements of JEDEC Tentative Standard No. 13B, “Standard Speciﬁcations for Description of ‘B’ Series CMOS Devices” Applications • Digital Multiplexing • Shift Right/Shift Left Registers • True/Complement Selection Description CD40257BMS is a data selector/multiplexer featuring three state outputs which can interface directly with and drive data lines of bus oriented systems. The CD40257BMS is supplied in these 16-lead outline packages: Braze Seal DIP Frit Seal DIP Ceramic Flatpack H4T H1E H3X Functional Diagram 2 A1 3 B1 5 A2 6 B2 11 A3 10 B3 14 A4 13 B4 OUTPUT DISABLE 15 1 INPUT SELECT 4 D1 7 D2 9 D3 12 D4 VDD = 16 VSS = 8 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 \| Copyright © Intersil Corporation 1999 7-1442 File Number 3364 1 page Speciﬁcations CD40257BMS TABLE 6. APPLICABLE SUBGROUPS CONFORMANCE GROUP MIL-STD-883 METHOD GROUP A SUBGROUPS Initial Test (Pre Burn-In) 100% 5004 1, 7, 9 Interim Test 1 (Post Burn-In) 100% 5004 1, 7, 9 Interim Test 2 (Post Burn-In) 100% 5004 1, 7, 9 PDA (Note 1) 100% 5004 1, 7, 9, Deltas Interim Test 3 (Post Burn-In) 100% 5004 1, 7, 9 PDA (Note 1) 100% 5004 1, 7, 9, Deltas Final Test 100% 5004 2, 3, 8A, 8B, 10, 11 Group A Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11 Group B Subgroup B-5 Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroup B-6 Sample 5005 1, 7, 9 Group D Sample 5005 1, 2, 3, 8A, 8B, 9 NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2. READ AND RECORD IDD, IOL5, IOH5A IDD, IOL5, IOH5A IDD, IOL5, IOH5A IDD, IOL5, IOH5A Subgroups 1, 2, 3, 9, 10, 11 Subgroups 1, 2 3 CONFORMANCE GROUPS Group E Subgroup 2 TABLE 7. TOTAL DOSE IRRADIATION MIL-STD-883 METHOD TEST PRE-IRRAD POST-IRRAD 5005 1, 7, 9 Table 4 READ AND RECORD PRE-IRRAD POST-IRRAD 1, 9 Table 4 TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS OSCILLATOR FUNCTION OPEN GROUND VDD 9V ± -0.5V 50kHz 25kHz Static Burn-In 1 (Note 1) 4, 7, 9, 12 1-3, 5, 6, 8, 10, 11, 13-15 16 Static Burn-In 2 (Note 1) 4, 7, 9, 12 8, 15 1-3, 5, 6, 10, 11, 13, 14, 16 Dynamic Burn- In (Note 1) - 8, 15 16 4, 7, 9, 12 2, 3, 5, 6, 10, 11, 1 13, 14 Irradiation (Note 2) 4, 7, 9, 12 8 1-3, 5, 6, 10, 11, 13-16 NOTES: 1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V 2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ± 0.5V 7-1446 5 Page

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