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PDF AD7911 Data sheet ( Hoja de datos )

Número de pieza AD7911
Descripción 10-/12-Bit ADCs
Fabricantes Analog Devices 
Logotipo Analog Devices Logotipo



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FEATURES
Fast throughput rate: 250 kSPS
Specified for VDD of 2.35 V to 5.25 V
Low power:
4 mW typ at 250 kSPS with 3 V supplies
13.5 mW typ at 250 kSPS with 5 V supplies
Wide input bandwidth:
71 dB minimum SNR at 100 kHz input frequency
Flexible power/serial clock speed management
No pipeline delays
High speed serial interface:
SPI®/QSPI™/MICROWIRE™/DSP compatible
Standby mode: 1 μA maximum
8-lead TSOT package
8-lead MSOP package
APPLICATIONS
Battery-powered systems:
Personal digital assistants
Medical instruments
Mobile communications
Instrumentation and control systems
Data acquisition systems
High speed modems
Optical sensors
GENERAL DESCRIPTION
The AD7911/AD79211 are 10-bit and 12-bit, high speed, low
power, 2-channel successive approximation ADCs, respectively.
The parts operate from a single 2.35 V to 5.25 V power supply
and feature throughput rates of up to 250 kSPS. The parts
contain a low noise, wide bandwidth track-and-hold amplifier,
which can handle input frequencies in excess of 6 MHz. The
conversion process and data acquisition are controlled using CS
and the serial clock, allowing the devices to interface with
microprocessors or DSPs. The input signal is sampled on the
falling edge of CS, and the conversion is also initiated at this
point. There are no pipeline delays associated with the part.
The channel to be converted is selected through the DIN pin,
and the mode of operation is controlled by CS. The serial data
stream from the DOUT pin has a channel identifier bit, which
provides information about the converted channel.
1 Protected by U.S. Patent Number 6,681,332.
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
2-Channel, 2.35 V to 5.25 V
250 kSPS, 10-/12-Bit ADCs
AD7911/AD7921
FUNCTIONAL BLOCK DIAGRAM
VDD
VIN0
VIN1
MUX
T/H
10-/12-BIT
SUCCESSIVE
APPROXIMATION
ADC
AD7911/AD7921 CONTROL LOGIC
GND
Figure 1.
SCLK
CS
DOUT
DIN
The AD7911/AD7921 use advanced design techniques to
achieve very low power dissipation at high throughput rates.
The reference for the part is taken internally from VDD, thereby
allowing the widest dynamic input range to the ADC. The
analog input range for the part, therefore, is 0 to VDD. The
conversion rate is determined by the SCLK signal.
PRODUCT HIGHLIGHTS
1. 2-channel, 250 kSPS, 10-/12-bit ADCs in TSOT package.
2. Low power consumption.
3. Flexible power/serial clock speed management.
The conversion rate is determined by the serial clock;
conversion time is reduced when the serial clock speed is
increased. The parts also feature a power-down mode to
maximize power efficiency at lower throughput rates.
Average power consumption is reduced when the power-
down mode is used while not converting. Current
consumption is 1 μA maximum and 50 nA typically when
in power-down mode.
4. Reference derived from the power supply.
5. No pipeline delay.
The parts feature a standard successive approximation
ADC with accurate control of the sampling instant via a CS
input and once-off conversion control.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703 ©2004–2011 Analog Devices, Inc. All rights reserved.

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AD7911 pdf
AD7911/AD7921
AD7921 SPECIFICATIONS
Temperature range for A Grade from −40°C to +85°C.
VDD = 2.35 V to 5.25 V, fSCLK = 5 MHz, fSAMPLE = 250 kSPS; TA = TMIN to TMAX, unless otherwise noted.
Table 2.
Parameter
DYNAMIC PERFORMANCE
Signal-to-Noise and Distortion (SINAD)2
Signal-to-Noise Ratio (SNR)2
Total Harmonic Distortion (THD)2
Peak Harmonic or Spurious Noise (SFDR)2
Intermodulation Distortion (IMD)2
Second-Order Terms
Third-Order Term
Aperture Delay
Aperture Jitter
Channel-to-Channel Isolation2
Full Power Bandwidth
DC ACCURACY
Resolution
Integral Nonlinearity2
Differential Nonlinearity2
Offset Error2
Offset Error Match2, 3
Gain Error2
Gain Error Match2, 3
Total Unadjusted Error (TUE)2
ANALOG INPUT
Input Voltage Ranges
DC Leakage Current
Input Capacitance
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current, IIN, SCLK Pin
Input Current, IIN, CS Pin
Input Current, IIN, DIN Pin
Input Capacitance, CIN3
LOGIC OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
Floating-State Leakage Current
Floating-State Output Capacitance3
Output Coding
See notes at end of table.
A Grade1
Unit
70 dB min
72 dB typ
71 dB min
72.5 dB typ
−81 dB typ
−84 dB typ
−84 dB typ
−86 dB typ
10 ns typ
30 ps typ
−90 dB typ
8.5 MHz typ
1.5 MHz typ
12
±1.5
−0.9/+1.5
±1.5
±0.5
±0.5
±2
±0.3
±1
±1.5
Bits
LSB max
LSB max
LSB max
LSB typ
LSB max
LSB max
LSB typ
LSB max
LSB max
0 to VDD
±0.3
20
V
μA max
pF typ
0.7 (VDD)
2
0.3
0.2 (VDD)
0.8
±0.3
±0.3
±0.3
5
V min
V min
V max
V max
V max
μA max
μA max
μA max
pF max
VDD − 0.2
V min
0.2 V max
±0.3 μA max
5 pF max
Straight (natural) binary
Test Conditions/Comments
fIN = 100 kHz sine wave
fa = 100.73 kHz, fb = 90.72 kHz
fa = 100.73 kHz, fb = 90.72 kHz
@ 3 dB
@ 0.1 dB
Guaranteed no missed codes to 12 bits
2.35 V ≤ VDD ≤ 2.7 V
2.7 V < VDD ≤ 5.25 V
VDD = 2.35 V
2.35 V < VDD ≤ 2.7 V
2.7 V < VDD ≤ 5.25 V
VIN = 0 V or VDD
ISOURCE = 200 μA; VDD = 2.35 V to 5.25 V
ISINK = 200 μA
Rev. A | Page 5 of 28

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AD7911 arduino
TERMINOLOGY
Integral Nonlinearity
The maximum deviation from a straight line passing through
the endpoints of the ADC transfer function. For the AD7911/
AD7921, the endpoints of the transfer function are zero scale, a
point 1 LSB below the first code transition, and full scale, a
point 1 LSB above the last code transition.
Differential Nonlinearity
The difference between the measured and the ideal 1 LSB
change between any two adjacent codes in the ADC.
Offset Error
The deviation of the first code transition (00…000) to
(00…001) from the ideal, that is, AGND + 1 LSB.
Offset Error Match
The difference in offset error between any two channels.
Gain Error
The deviation of the last code transition (111…110) to
(111…111) from the ideal, that is, VREF − 1 LSB after the offset
error has been adjusted out.
Gain Error Match
The difference in gain error between any two channels.
Total Unadjusted Error
A comprehensive specification that includes gain error, linearity
error, and offset error.
Channel-to-Channel Isolation
A measure of the level of crosstalk between channels. It is
measured by applying a full-scale sine wave signal of 20 kHz to
500 kHz to the nonselected input channel and determining how
much that signal is attenuated in the selected channel with a
10 kHz signal. The figure is given worst case across both
channels for the AD7911/AD7921.
Track-and-Hold Acquisition Time
The time required for the output of the track-and-hold
amplifier to reach its final value within ±1 LSB after the end of
conversion. The track-and-hold amplifier returns to track mode
at the end of conversion. See the Serial Interface section for
more details.
AD7911/AD7921
Signal-to-Noise and Distortion Ratio (SINAD)
The measured ratio of signal-to-noise and distortion at the
output of the A/D converter. The signal is the rms value of the
sine wave, and noise is the rms sum of all nonfundamental
signals up to half the sampling frequency (fs/2), including
harmonics but excluding dc.
Signal-to-Noise Ratio (SNR)
The measured ratio of signal to noise at the output to the A/D
converter. The signal is the rms value of the sine wave input.
Noise is the rms quantization error within the Nyquist
bandwidth (fs/2). The rms value of a sine wave is one-half its
peak-to-peak value divided by √2, and the rms value for the
quantization noise is q/√12. The ratio is dependent on the
number of quantization levels in the digitization process; the
more levels, the smaller the quantization noise. For an ideal
N-bit converter, the SNR is defined as
SNR = 6.02 N + 1.76 dB
Therefore, for a 12-bit converter, SNR is 74 dB; for a 10-bit
converter, SNR is 62 dB.
However, various error sources in the ADC cause the measured
SNR to be less than the theoretical value. These errors occur
due to integral and differential nonlinearities, internal ac noise
sources, and so on.
Total Harmonic Distortion (THD)
The ratio of the rms sum of harmonics to the fundamental,
which is defined as
THD (dB) = 20 log V2 2 + V3 2 + V4 2 + V5 2 + V6 2
V1
where:
V1 is the rms amplitude of the fundamental.
V2, V3, V4, V5, and V6 are the rms amplitudes of the second
through the sixth harmonics.
Peak Harmonic or Spurious Noise
The ratio of the rms value of the next largest component in the
ADC output spectrum (up to fs/2 and excluding dc) to the rms
value of the fundamental. Normally, the value of this specifica-
tion is determined by the largest harmonic in the spectrum, but
for ADCs where the harmonics are buried in the noise floor, it
is a noise peak.
Rev. A | Page 11 of 28

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