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Aeroflex Circuit Technology - Analog Voltage Multiplexer

Numéro de référence RHD5921
Description Analog Voltage Multiplexer
Fabricant Aeroflex Circuit Technology 
Logo Aeroflex Circuit Technology 





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RHD5921 fiche technique
Standard Products
RadHard-by-Design
Datasheet
RHD5921 Analog Voltage Multiplexer
16-Channel, Buffered
www.aeroflex.com/RHDseries
March 4, 2015
FEATURES
Single power supply operation at 3.3V to 5V
Radiation performance
- Total dose:
>1Mrad(Si); Dose rate = 50 - 300 rads(Si)/s
- ELDRS Immune
- SEL Immune
>100 MeV-cm2/mg
- Neutron Displacement Damage >1014 neutrons/cm2
Full military temperature range
Low Power consumption when enabled
CMOS analog switching allows rail to rail operation and low switch impedance
Address bus (A0-3), and one enable line
High input impedance
Designed for aerospace and high reliability space applications
Packaging – Hermetic ceramic
- 24-pin, 0.614"L x 0.300"W x 0.105"Ht SOIC
- Typical Weight 2 grams
Aeroflex Plainview’s Radiation Hardness Assurance Plan is DLA Certified to MIL-PRF-38534, Appendix G.
GENERAL DESCRIPTION
Aeroflex’s RHD5921 is a radiation hardened, single supply, 16 channel buffered output multiplexer in a
24-pin SOIC package. The RHD5921 design uses specific circuit topology and layout methods to mitigate
total ionizing dose effects and single event latchup. These characteristics make the RHD5921 especially
suited for the harsh environment encountered in Deep Space missions. It is guaranteed operational from
-55°C to +125°C. Available screened in accordance with MIL-PRF-38534 Class K, the RHD5921 is ideal
for demanding military and space applications.
ORGANIZATION AND APPLICATION
The RHD5921 is a 16 to 1 CMOS buffered output voltage multiplexer. Channel selection is controlled by 4
bit binary addressing and an active low enable. Multiplexed voltages are buffered by a unity gain CMOS
Rail-to-Rail amplifier. When the RHD5921 is disabled, the chip is put into a power-down state and the
output is tri-stated.
The devices will not latch with SEU events to above 100 MeV-cm2/mg. Total dose degradation is minimal
to above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 1014
neutrons per cm2 range are readily tolerated. There is no sensitivity to low-dose rate (ELDRS) effects. SEU
effects are application dependent.
SCD5921 Rev D

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