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Número de pieza | KAF-1001-AAA | |
Descripción | CCD IMAGE SENSOR | |
Fabricantes | ON Semiconductor | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de KAF-1001-AAA (archivo pdf) en la parte inferior de esta página. Total 23 Páginas | ||
No Preview Available ! KAF-1001 IMAGE SENSOR
1024 (H) X 1024 (V) FULL FRAME CCD IMAGE SENSOR
JUNE 18, 2014
DEVICE PERFORMANCE SPECIFICATION
REVISION 1.1 PS-0033
1 page KAF-1001 Image Sensor
Ordering Information
Catalog
Number
Product Name
4H0016
KAF- 1001-AAA-CP-B1
4H0017
KAF- 1001-AAA-CP-B2
4H0019
KAF- 1001-AAA-CP-AE
4H0842
KAF- 1001-AAA-CB-AE
4H0847
4H0080
KAF- 1001-AAA-CB-B2
KEK-4H0080-KAF-1001-12-5
Description
Monochrome, No Microlens, CERDIP Package (sidebrazed), Taped Clear
Cover Glass, no coatings, Grade 1
Monochrome, No Microlens, CERDIP Package (sidebrazed), Taped Clear
Cover Glass, no coatings, Grade 2
Monochrome, No Microlens, CERDIP Package (sidebrazed), Taped Clear
Cover Glass, no coatings, Engineering Sample
Monochrome, No Microlens, CERDIP Package (sidebrazed), Clear Cover
Glass (no coatings), Engineering Sample
Monochrome, No Microlens, CERDIP Package (sidebrazed), Clear Cover
Glass (no coatings), Grade 2
Evaluation Board (Complete Kit)
Marking Code
KAF-1001-AAA
[Serial Number]
N/A
See Application Note Product Naming Convention for a full description of the naming convention used for image
sensors. For reference documentation, including information on evaluation kits, please visit our web site at
www.truesenseimaging.com.
Please address all inquiries and purchase orders to:
Truesense Imaging, Inc.
1964 Lake Avenue
Rochester, New York 14615
Phone: (585) 784-5500
E-mail: [email protected]
ON Semiconductor reserves the right to change any information contained herein without notice. All information
furnished by ON Semiconductor is believed to be accurate.
www.truesenseimaging.com
Revision 1.1 PS-0033 Pg 5
5 Page KAF-1001 Image Sensor
Notes:
1. Point where the output saturates when operated with nominal voltages.
2. Signal level at the onset of blooming in the vertical (parallel) CCD register
3. Maximum signal level at the output of the high dynamic range output. This signal level will only be achieved when binning
pixels containing large signals.
4. None of 64 sub arrays (128 x 128) exceed the maximum dark current specification.
5. For 2 MHz data rate and T = 30 °C to -40 °C.
6. Using maximum CCD frequency and/or minimum CCD transfer times may compromise performance
7. Time between the rising edge of φV1 and the first falling edge of φH1
8.
9.
AUtseTsin2te0grLaOtioGn =(N0e;-dsaatt/anrea- ttoeta=l)
1 MHz; temperature = -30 °C
where Ne- sat refers to the amplifier
saturation
signal.
10. A parameter that is measured on every sensor during production testing.
11. A parameter that is quantified during the design verification activity.
www.truesenseimaging.com
Revision 1.1 PS-0033 Pg 11
11 Page |
Páginas | Total 23 Páginas | |
PDF Descargar | [ Datasheet KAF-1001-AAA.PDF ] |
Número de pieza | Descripción | Fabricantes |
KAF-1001-AAA | CCD IMAGE SENSOR | ON Semiconductor |
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