DataSheetWiki


KAI-08051 fiches techniques PDF

ON Semiconductor - Interline CCD Image Sensor

Numéro de référence KAI-08051
Description Interline CCD Image Sensor
Fabricant ON Semiconductor 
Logo ON Semiconductor 





1 Page

No Preview Available !





KAI-08051 fiche technique
KAI-08051
3296 (H) x 2472 (V)
Interline CCD Image Sensor
Description
The KAI08051 Image Sensor is an 8megapixel CCD in a 4/3”
optical format that provides increased QE, reduced read noise, and
improved color accuracy compared to earlier generation devices in the
TRUESENSE 5.5 micron Interline Transfer CCD family. The sensor
features broad dynamic range, excellent imaging performance, and a
flexible readout architecture that enables use of 1, 2, or 4 outputs. Full
resolution readout is supported at up to 16 frames per second, a Region
of Interest (ROI) mode supports partial readout of the sensor at even
higher frame rates.
The sensor is available with the TRUESENSE Sparse Color Filter
Pattern, which provides a 2x improvement in light sensitivity
compared to a standard color Bayer part.
The sensor shares common pinout and electrical configurations
with other devices based on the TRUESENSE 5.5 micron Interline
Transfer Platform, allowing a single camera design to support multiple
members of this family.
Table 1. GENERAL SPECIFICATIONS
Parameter
Typical Value
Architecture
Interline CCD; Progressive Scan
Total Number of Pixels
3364 (H) x 2520 (V)
Number of Effective Pixels
3320 (H) x 2496 (V)
Number of Active Pixels
3296 (H) x 2472 (V)
Pixel Size
Active Image Size
5.5 mm (H) x 5.5 mm (V)
18.13 mm (H) x 13.60 mm (V)
22.66 mm (diag), 4/3” optical format
Aspect Ratio
4:3
Number of Outputs
1, 2, or 4
Charge Capacity
20,000 electrons
Output Sensitivity
39 mV/e
Quantum Efficiency
RGB (FXAJD, FXAJP (no glass), QXPJD)
RGB (FBAJD, FBAJP (no glass))
Mono, PAN (AAAJP)
Mono (AXAJD, AXAJP (no glass))
Mono (ABAJD, ABAJP (no glass))
33%, 41%, 42%
30%, 37%, 39%
4.0%, 4.4%
51%
52%
Read Noise (f = 40 MHz)
10 e
Dark Current
Photodiode
VCCD
Dark Current Doubling Temp.
Photodiode
VCCD
Dynamic Range
7 electrons/s
100 electrons/s
7°C
9°C
66 dB
Charge Transfer Efficiency
0.999999
Blooming Suppression
> 300 X
Smear
100 dB
Image Lag
< 10 electrons
Maximum Pixel Clock Speed
40 MHz
Maximum Frame Rates
Quad Output
Dual Output
Single Output
16 fps
8 fps
4 fps
Package
68 pin PGA
Cover Glass
AR coated, 2 Sides or Clear Glass
NOTE: All parameters are specified at T = 40°C unless otherwise noted.
© Semiconductor Components Industries, LLC, 2015
December, 2015 Rev. 5
1
www.onsemi.com
Figure 1. KAI08051 CCD Image Sensor
Features
Increased QE, Reduced Read Noise, and
and Improved Color Accuracy
Bayer Color Pattern, TRUESENSE Sparse
Color Filter Pattern, and Monochrome
Configurations
Progressive Scan Readout
Flexible Readout Architecture
High Frame Rate
High Sensitivity
Low Noise Architecture
Excellent Smear Performance
Package Pin Reserved for Device
Identification
Applications
Industrial Imaging
Medical Imaging
Security
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
Publication Order Number:
KAI08051/D

PagesPages 30
Télécharger [ KAI-08051 ]


Fiche technique recommandé

No Description détaillée Fabricant
KAI-08051 Interline CCD Image Sensor ON Semiconductor
ON Semiconductor
KAI-08052 Interline CCD Image Sensor ON Semiconductor
ON Semiconductor

US18650VTC5A

Lithium-Ion Battery

Sony
Sony
TSPC106

PCI Bus Bridge Memory Controller

ATMEL
ATMEL
TP9380

NPN SILICON RF POWER TRANSISTOR

Advanced Semiconductor
Advanced Semiconductor


www.DataSheetWiki.com    |   2020   |   Contactez-nous  |   Recherche